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Nanosecond transmission electron microscopy and diffraction

Publication ,  Journal Article
Bostanjoglo, O; Tornow, RP; Tornow, W
Published in: Journal of Physics E: Scientific Instruments
December 1, 1987

A conventional TEM was extended to a time-resolving instrument by installing a pulsed microchannel plate as a low-cost time-resolving image detector and a pulsed electron beam shutter. The technique provides electron micrographs and diffraction pictures of non-recurring events on the nanosecond/micrometre scale within a commercial TEM.

Duke Scholars

Published In

Journal of Physics E: Scientific Instruments

DOI

ISSN

0022-3735

Publication Date

December 1, 1987

Volume

20

Issue

5

Start / End Page

556 / 557
 

Citation

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ICMJE
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Bostanjoglo, O., Tornow, R. P., & Tornow, W. (1987). Nanosecond transmission electron microscopy and diffraction. Journal of Physics E: Scientific Instruments, 20(5), 556–557. https://doi.org/10.1088/0022-3735/20/5/018
Bostanjoglo, O., R. P. Tornow, and W. Tornow. “Nanosecond transmission electron microscopy and diffraction.” Journal of Physics E: Scientific Instruments 20, no. 5 (December 1, 1987): 556–57. https://doi.org/10.1088/0022-3735/20/5/018.
Bostanjoglo O, Tornow RP, Tornow W. Nanosecond transmission electron microscopy and diffraction. Journal of Physics E: Scientific Instruments. 1987 Dec 1;20(5):556–7.
Bostanjoglo, O., et al. “Nanosecond transmission electron microscopy and diffraction.” Journal of Physics E: Scientific Instruments, vol. 20, no. 5, Dec. 1987, pp. 556–57. Scopus, doi:10.1088/0022-3735/20/5/018.
Bostanjoglo O, Tornow RP, Tornow W. Nanosecond transmission electron microscopy and diffraction. Journal of Physics E: Scientific Instruments. 1987 Dec 1;20(5):556–557.

Published In

Journal of Physics E: Scientific Instruments

DOI

ISSN

0022-3735

Publication Date

December 1, 1987

Volume

20

Issue

5

Start / End Page

556 / 557