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Stress activated Raman scattering and microcrack detection

Publication ,  Journal Article
Ciftan, M; Brown, RG; Saibel, E
Published in: International Journal of Engineering Science
January 1, 1983

A new technique for the detection of microcrack precursors and for the study of the dynamics of crack propagation is proposed. The technique uses laser Raman scattering off of adsorbed surface species to detect microcrack precursors via variations in the Raman spectrum associated with the stresses localized within such precursors. We give extensive theoretical justification and detail several approaches designed to substantiate the plausability of the technique proposed. This technique can become a valuable tool for the detection of microcrack precursors as well as studies of phenomena including adsorption, catalysis. adhesion, wear and the dynamics of stress-corrosion cracking. © 1983.

Duke Scholars

Published In

International Journal of Engineering Science

DOI

ISSN

0020-7225

Publication Date

January 1, 1983

Volume

21

Issue

11

Start / End Page

1285 / 1293

Related Subject Headings

  • Mechanical Engineering & Transports
  • 0905 Civil Engineering
  • 0102 Applied Mathematics
 

Citation

APA
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ICMJE
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Ciftan, M., Brown, R. G., & Saibel, E. (1983). Stress activated Raman scattering and microcrack detection. International Journal of Engineering Science, 21(11), 1285–1293. https://doi.org/10.1016/0020-7225(83)90125-8
Ciftan, M., R. G. Brown, and E. Saibel. “Stress activated Raman scattering and microcrack detection.” International Journal of Engineering Science 21, no. 11 (January 1, 1983): 1285–93. https://doi.org/10.1016/0020-7225(83)90125-8.
Ciftan M, Brown RG, Saibel E. Stress activated Raman scattering and microcrack detection. International Journal of Engineering Science. 1983 Jan 1;21(11):1285–93.
Ciftan, M., et al. “Stress activated Raman scattering and microcrack detection.” International Journal of Engineering Science, vol. 21, no. 11, Jan. 1983, pp. 1285–93. Scopus, doi:10.1016/0020-7225(83)90125-8.
Ciftan M, Brown RG, Saibel E. Stress activated Raman scattering and microcrack detection. International Journal of Engineering Science. 1983 Jan 1;21(11):1285–1293.
Journal cover image

Published In

International Journal of Engineering Science

DOI

ISSN

0020-7225

Publication Date

January 1, 1983

Volume

21

Issue

11

Start / End Page

1285 / 1293

Related Subject Headings

  • Mechanical Engineering & Transports
  • 0905 Civil Engineering
  • 0102 Applied Mathematics