Scholars@Duke

Scanning Hall probe microscopy

Publication ,  Journal Article
Chang, AM; Hallen, HD; Harriott, L; Hess, HF; Kao, HL; Kwo, J; Miller, RE; Wolfe, R; Van Der Ziel, J; Chang, TY
Published in: Applied Physics Letters
January 1, 1992
Published version (DOI)

We describe the implementation of a scanning Hall probe microscope of outstanding magnetic field sensitivity (∼0.1 G) and unprecedented spatial resolution (∼0.35 μm) to detect surface magnetic fields at close proximity to a sample. Our microscope combines the advantages of a submicron Hall probe fabricated on a GaAs/Al0.3Ga0.7As heterostructure chip and the scanning tunneling microscopy technique for precise positioning. We demonstrate its usefulness by imaging individual vortices in high Tc La1.85Sr0.15CuO4 films and superconducting networks, and magnetic bubble domains.

Duke Scholars

Albert M. Chang
Author Albert M. Chang Physics
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Published In

Applied Physics Letters

DOI

10.1063/1.108334

ISSN

0003-6951

Publication Date

January 1, 1992

Volume

61

Issue

16

Start / End Page

1974 / 1976

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Chang, A. M., Hallen, H. D., Harriott, L., Hess, H. F., Kao, H. L., Kwo, J., … Chang, T. Y. (1992). Scanning Hall probe microscopy. Applied Physics Letters, 61(16), 1974–1976. https://doi.org/10.1063/1.108334
Chang, A. M., H. D. Hallen, L. Harriott, H. F. Hess, H. L. Kao, J. Kwo, R. E. Miller, R. Wolfe, J. Van Der Ziel, and T. Y. Chang. “Scanning Hall probe microscopy.” Applied Physics Letters 61, no. 16 (January 1, 1992): 1974–76. https://doi.org/10.1063/1.108334.
Chang AM, Hallen HD, Harriott L, Hess HF, Kao HL, Kwo J, et al. Scanning Hall probe microscopy. Applied Physics Letters. 1992 Jan 1;61(16):1974–6.
Chang, A. M., et al. “Scanning Hall probe microscopy.” Applied Physics Letters, vol. 61, no. 16, Jan. 1992, pp. 1974–76. Scopus, doi:10.1063/1.108334.
Chang AM, Hallen HD, Harriott L, Hess HF, Kao HL, Kwo J, Miller RE, Wolfe R, Van Der Ziel J, Chang TY. Scanning Hall probe microscopy. Applied Physics Letters. 1992 Jan 1;61(16):1974–1976.

Published In

Applied Physics Letters

DOI

10.1063/1.108334

ISSN

0003-6951

Publication Date

January 1, 1992

Volume

61

Issue

16

Start / End Page

1974 / 1976

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences