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Work-site clinical and neurobehavioral assessment of solvent-exposed microelectronics workers.

Publication ,  Journal Article
Broadwell, DK; Darcey, DJ; Hudnell, HK; Otto, DA; Boyes, WK
Published in: Am J Ind Med
May 1995

Twenty-five workers, five currently and 20 formerly involved in the manufacture of hybrid microcircuits, underwent clinical evaluations at the request of a management-union committee concerned about chronic solvent exposures in a research and development laboratory. A battery of neurobehavioral tests was administered to compare the solvent-exposed group with 32 age-, gender-, ethnicity-, and education-matched controls. The tests included: MMPI-I, hand grip strength, tactile sensitivity, dexterity, color discrimination, visual acuity and contrast sensitivity, and tests selected from the computerized Neurobehavioral Evaluation System (NES2). Clinical narratives and retrospective exposure assessments in the study group suggested chronic low-level exposure to solvents, with intermittent acute excursions. Work-related diagnoses included upper respiratory mucosal irritation and sinusitis (44%), lower respiratory reactive airway disease (12%), and dermatitis (5%). Three workers (12%) had findings consistent with a solvent-induced encephalopathy. Significant differences (after Bonferroni correction) were found between the two groups on 5 of 11 NES subtests: symptom scale, mood scale, finger tapping, simple reaction time, and symbol-digit substitution. Differences also reached significance for overall vibration sensitivity thresholds, visual contrast sensitivity, and grip strength. The MMPI average clinical scale elevation was significantly higher in the exposed group than controls. These results support an association between chronic low-dose solvent exposure and measurable neurobehavioral changes.

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Published In

Am J Ind Med

DOI

ISSN

0271-3586

Publication Date

May 1995

Volume

27

Issue

5

Start / End Page

677 / 698

Location

United States

Related Subject Headings

  • Workplace
  • Solvents
  • Sensitivity and Specificity
  • Risk Assessment
  • Respiratory Tract Diseases
  • Occupational Exposure
  • Occupational Diseases
  • Neuropsychological Tests
  • Nervous System Diseases
  • Middle Aged
 

Citation

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ICMJE
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Broadwell, D. K., Darcey, D. J., Hudnell, H. K., Otto, D. A., & Boyes, W. K. (1995). Work-site clinical and neurobehavioral assessment of solvent-exposed microelectronics workers. Am J Ind Med, 27(5), 677–698. https://doi.org/10.1002/ajim.4700270505
Broadwell, D. K., D. J. Darcey, H. K. Hudnell, D. A. Otto, and W. K. Boyes. “Work-site clinical and neurobehavioral assessment of solvent-exposed microelectronics workers.Am J Ind Med 27, no. 5 (May 1995): 677–98. https://doi.org/10.1002/ajim.4700270505.
Broadwell DK, Darcey DJ, Hudnell HK, Otto DA, Boyes WK. Work-site clinical and neurobehavioral assessment of solvent-exposed microelectronics workers. Am J Ind Med. 1995 May;27(5):677–98.
Broadwell, D. K., et al. “Work-site clinical and neurobehavioral assessment of solvent-exposed microelectronics workers.Am J Ind Med, vol. 27, no. 5, May 1995, pp. 677–98. Pubmed, doi:10.1002/ajim.4700270505.
Broadwell DK, Darcey DJ, Hudnell HK, Otto DA, Boyes WK. Work-site clinical and neurobehavioral assessment of solvent-exposed microelectronics workers. Am J Ind Med. 1995 May;27(5):677–698.
Journal cover image

Published In

Am J Ind Med

DOI

ISSN

0271-3586

Publication Date

May 1995

Volume

27

Issue

5

Start / End Page

677 / 698

Location

United States

Related Subject Headings

  • Workplace
  • Solvents
  • Sensitivity and Specificity
  • Risk Assessment
  • Respiratory Tract Diseases
  • Occupational Exposure
  • Occupational Diseases
  • Neuropsychological Tests
  • Nervous System Diseases
  • Middle Aged