The ion implantation of helium into gold. A combined X‐ray reflection spectroscopy and Rutherford backscattering study
Publication
, Journal Article
Cocks, FH; Pollock, JTA
Published in: physica status solidi (a)
January 1, 1986
Two methods are used to investigate the very near surface (0 to 10 nm) effect of 3 keV helium implantation into evaporated gold films. X‐ray reflection spectroscopy is used to determine the change in density of theimplanted layer and Rutherford backscattering to determine helium concentrations; a maximum of 3.3 He atoms per metal vacancy is reported for a fluence of 4.0 × × 1016 atoms cm−2. The data support the proposition that for implant conditions below those required for exfoliation, there are helium pressures well in excess of 100 kbar within implantation induced voids. Copyright © 1986 WILEY‐VCH Verlag GmbH & Co. KGaA
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Published In
physica status solidi (a)
DOI
EISSN
1521-396X
ISSN
0031-8965
Publication Date
January 1, 1986
Volume
95
Issue
1
Start / End Page
141 / 148
Related Subject Headings
- Applied Physics
- 5104 Condensed matter physics
- 4018 Nanotechnology
- 4016 Materials engineering
- 1007 Nanotechnology
- 0912 Materials Engineering
- 0204 Condensed Matter Physics
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Cocks, F. H., & Pollock, J. T. A. (1986). The ion implantation of helium into gold. A combined X‐ray reflection spectroscopy and Rutherford backscattering study. Physica Status Solidi (A), 95(1), 141–148. https://doi.org/10.1002/pssa.2210950117
Cocks, F. H., and J. T. A. Pollock. “The ion implantation of helium into gold. A combined X‐ray reflection spectroscopy and Rutherford backscattering study.” Physica Status Solidi (A) 95, no. 1 (January 1, 1986): 141–48. https://doi.org/10.1002/pssa.2210950117.
Cocks FH, Pollock JTA. The ion implantation of helium into gold. A combined X‐ray reflection spectroscopy and Rutherford backscattering study. physica status solidi (a). 1986 Jan 1;95(1):141–8.
Cocks, F. H., and J. T. A. Pollock. “The ion implantation of helium into gold. A combined X‐ray reflection spectroscopy and Rutherford backscattering study.” Physica Status Solidi (A), vol. 95, no. 1, Jan. 1986, pp. 141–48. Scopus, doi:10.1002/pssa.2210950117.
Cocks FH, Pollock JTA. The ion implantation of helium into gold. A combined X‐ray reflection spectroscopy and Rutherford backscattering study. physica status solidi (a). 1986 Jan 1;95(1):141–148.
Published In
physica status solidi (a)
DOI
EISSN
1521-396X
ISSN
0031-8965
Publication Date
January 1, 1986
Volume
95
Issue
1
Start / End Page
141 / 148
Related Subject Headings
- Applied Physics
- 5104 Condensed matter physics
- 4018 Nanotechnology
- 4016 Materials engineering
- 1007 Nanotechnology
- 0912 Materials Engineering
- 0204 Condensed Matter Physics