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Mode coupling and leakage effects in finite-size printed interconnects

Publication ,  Journal Article
Carin, L; Slade, GW; Webb, KJ
Published in: IEEE Transactions on Microwave Theory and Techniques
December 1, 1998

A multimode analysis is used to describe how leakage effects are manifested in general printed interconnects situated on substrates of finite size. In the vicinity of discrete frequencies, it is shown that the analysis reduces to classical coupled-mode theory. The general results are then specialized to the particular case of shielded microstrip on an anisotropic substrate, for which numerical and experimental mode-coupling results are presented. The numerical results are demonstrated in the form of dispersion curves and field plots, and are computed using the finite-element method and the spectral-domain technique. The experimental results are performed using a network analyzer, and are given in terms of scattering parameters. © 1998 IEEE.

Duke Scholars

Published In

IEEE Transactions on Microwave Theory and Techniques

DOI

ISSN

0018-9480

Publication Date

December 1, 1998

Volume

46

Issue

5 PART 1

Start / End Page

450 / 457

Related Subject Headings

  • Networking & Telecommunications
  • 5103 Classical physics
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
 

Citation

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Carin, L., Slade, G. W., & Webb, K. J. (1998). Mode coupling and leakage effects in finite-size printed interconnects. IEEE Transactions on Microwave Theory and Techniques, 46(5 PART 1), 450–457. https://doi.org/10.1109/22.668641
Carin, L., G. W. Slade, and K. J. Webb. “Mode coupling and leakage effects in finite-size printed interconnects.” IEEE Transactions on Microwave Theory and Techniques 46, no. 5 PART 1 (December 1, 1998): 450–57. https://doi.org/10.1109/22.668641.
Carin L, Slade GW, Webb KJ. Mode coupling and leakage effects in finite-size printed interconnects. IEEE Transactions on Microwave Theory and Techniques. 1998 Dec 1;46(5 PART 1):450–7.
Carin, L., et al. “Mode coupling and leakage effects in finite-size printed interconnects.” IEEE Transactions on Microwave Theory and Techniques, vol. 46, no. 5 PART 1, Dec. 1998, pp. 450–57. Scopus, doi:10.1109/22.668641.
Carin L, Slade GW, Webb KJ. Mode coupling and leakage effects in finite-size printed interconnects. IEEE Transactions on Microwave Theory and Techniques. 1998 Dec 1;46(5 PART 1):450–457.

Published In

IEEE Transactions on Microwave Theory and Techniques

DOI

ISSN

0018-9480

Publication Date

December 1, 1998

Volume

46

Issue

5 PART 1

Start / End Page

450 / 457

Related Subject Headings

  • Networking & Telecommunications
  • 5103 Classical physics
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering