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Thin-Film integration for nanoscale and high frequency electronics on si

Publication ,  Journal Article
Laskar, J; Jokerst, N; Evers, N; Chun, C
Published in: Proceedings of SPIE - The International Society for Optical Engineering
December 1, 1997

The continued emergence of wireless applications as perhaps the most financially significant market in recent years, wireless technology has become a global core competency. The demand for increasingly higher rates of data transmission, low-power operation and high frequency operation will eventually require integration of nanoscale electronics into available Silicon technologies. A broad application base is expected for cointegrated resonant tunneling /CMOS technology (termed QMOS for quantum metal oxide semiconductor) because of the expected factor of 5 to 10 increase in functional density and speed when compared to conventional all-CMOS high speed circuit approaches. These circuits will be realized by integrating compound semiconductor resonant tunneling diodes and three terminal high frequency components with conventional CMOS circuitry through the use of thin-film integration processes. The focus of this work is to develop reliable, densely packed nanoelectronic interfaces to bring higher functionality to Si systems. We combine: (1) high performance, resonant tunneling electronics; (2) high frequency, wireless electronics; and (3) conventional CMOS electronics into a single wafer level integrated system.

Duke Scholars

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 1997

Volume

3212

Start / End Page

97 / 105

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

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Laskar, J., Jokerst, N., Evers, N., & Chun, C. (1997). Thin-Film integration for nanoscale and high frequency electronics on si. Proceedings of SPIE - The International Society for Optical Engineering, 3212, 97–105. https://doi.org/10.1117/12.284581
Laskar, J., N. Jokerst, N. Evers, and C. Chun. “Thin-Film integration for nanoscale and high frequency electronics on si.” Proceedings of SPIE - The International Society for Optical Engineering 3212 (December 1, 1997): 97–105. https://doi.org/10.1117/12.284581.
Laskar J, Jokerst N, Evers N, Chun C. Thin-Film integration for nanoscale and high frequency electronics on si. Proceedings of SPIE - The International Society for Optical Engineering. 1997 Dec 1;3212:97–105.
Laskar, J., et al. “Thin-Film integration for nanoscale and high frequency electronics on si.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 3212, Dec. 1997, pp. 97–105. Scopus, doi:10.1117/12.284581.
Laskar J, Jokerst N, Evers N, Chun C. Thin-Film integration for nanoscale and high frequency electronics on si. Proceedings of SPIE - The International Society for Optical Engineering. 1997 Dec 1;3212:97–105.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

ISSN

0277-786X

Publication Date

December 1, 1997

Volume

3212

Start / End Page

97 / 105

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering