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Integrated thin film photodetectors with vertically coupled microring resonators for chip scale spectral analysis

Publication ,  Journal Article
Cho, SY; Jokerst, NM
Published in: Applied Physics Letters
March 16, 2007

An integrated spectral analysis system using a thin film InGaAs metal-semiconductor-metal photodetector integrated with a vertically coupled polymer microring resonator was demonstrated for chip scale implementation. The integrated spectral analysis system has an excellent selectivity in measured spectral response as well as low dark current (3.2 nA). The measured full width half maximum of the spectral photoresponse at 5 V was 0.5 nm. © 2007 American Institute of Physics.

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Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

March 16, 2007

Volume

90

Issue

10

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Cho, S. Y., & Jokerst, N. M. (2007). Integrated thin film photodetectors with vertically coupled microring resonators for chip scale spectral analysis. Applied Physics Letters, 90(10). https://doi.org/10.1063/1.2711524
Cho, S. Y., and N. M. Jokerst. “Integrated thin film photodetectors with vertically coupled microring resonators for chip scale spectral analysis.” Applied Physics Letters 90, no. 10 (March 16, 2007). https://doi.org/10.1063/1.2711524.
Cho, S. Y., and N. M. Jokerst. “Integrated thin film photodetectors with vertically coupled microring resonators for chip scale spectral analysis.” Applied Physics Letters, vol. 90, no. 10, Mar. 2007. Scopus, doi:10.1063/1.2711524.

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

March 16, 2007

Volume

90

Issue

10

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences