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Embedded optical interconnections using thin film InGaAs metal-semiconductor-metal photodetectors

Publication ,  Journal Article
Huang, Z; Ueno, Y; Kaneko, K; Jokerst, NM; Tanahashi, S
Published in: Electronics Letters
December 5, 2002

The integration of InGaAs photodetectors embedded in a polymer interconnection waveguide on Si and ceramic electrical interconnection substrates has been demonstrated. The photodetector and substrate are independently fabricated and bonded, with subsequent waveguide integration. The embedding fabrication process, coupling, and bandwidth are reported at 1 Gbit/s.

Duke Scholars

Published In

Electronics Letters

DOI

ISSN

0013-5194

Publication Date

December 5, 2002

Volume

38

Issue

25

Start / End Page

1708 / 1709

Related Subject Headings

  • Electrical & Electronic Engineering
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0801 Artificial Intelligence and Image Processing
 

Citation

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Huang, Z., Ueno, Y., Kaneko, K., Jokerst, N. M., & Tanahashi, S. (2002). Embedded optical interconnections using thin film InGaAs metal-semiconductor-metal photodetectors. Electronics Letters, 38(25), 1708–1709. https://doi.org/10.1049/el:20021047
Huang, Z., Y. Ueno, K. Kaneko, N. M. Jokerst, and S. Tanahashi. “Embedded optical interconnections using thin film InGaAs metal-semiconductor-metal photodetectors.” Electronics Letters 38, no. 25 (December 5, 2002): 1708–9. https://doi.org/10.1049/el:20021047.
Huang Z, Ueno Y, Kaneko K, Jokerst NM, Tanahashi S. Embedded optical interconnections using thin film InGaAs metal-semiconductor-metal photodetectors. Electronics Letters. 2002 Dec 5;38(25):1708–9.
Huang, Z., et al. “Embedded optical interconnections using thin film InGaAs metal-semiconductor-metal photodetectors.” Electronics Letters, vol. 38, no. 25, Dec. 2002, pp. 1708–09. Scopus, doi:10.1049/el:20021047.
Huang Z, Ueno Y, Kaneko K, Jokerst NM, Tanahashi S. Embedded optical interconnections using thin film InGaAs metal-semiconductor-metal photodetectors. Electronics Letters. 2002 Dec 5;38(25):1708–1709.

Published In

Electronics Letters

DOI

ISSN

0013-5194

Publication Date

December 5, 2002

Volume

38

Issue

25

Start / End Page

1708 / 1709

Related Subject Headings

  • Electrical & Electronic Engineering
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
  • 0801 Artificial Intelligence and Image Processing