Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy.
Publication
, Journal Article
Stoner, BR; Ma, G; Wolter, SD; Glass, JT
Published in: Physical review. B, Condensed matter
May 1992
Duke Scholars
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Published In
Physical review. B, Condensed matter
DOI
ISSN
0163-1829
Publication Date
May 1992
Volume
45
Issue
19
Start / End Page
11067 / 11084
Citation
APA
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Stoner, B. R., Ma, G., Wolter, S. D., & Glass, J. T. (1992). Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy. Physical Review. B, Condensed Matter, 45(19), 11067–11084. https://doi.org/10.1103/physrevb.45.11067
Stoner, B. R., G. Ma, S. D. Wolter, and J. T. Glass. “Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy.” Physical Review. B, Condensed Matter 45, no. 19 (May 1992): 11067–84. https://doi.org/10.1103/physrevb.45.11067.
Stoner BR, Ma G, Wolter SD, Glass JT. Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy. Physical review B, Condensed matter. 1992 May;45(19):11067–84.
Stoner, B. R., et al. “Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy.” Physical Review. B, Condensed Matter, vol. 45, no. 19, May 1992, pp. 11067–84. Epmc, doi:10.1103/physrevb.45.11067.
Stoner BR, Ma G, Wolter SD, Glass JT. Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy. Physical review B, Condensed matter. 1992 May;45(19):11067–11084.
Published In
Physical review. B, Condensed matter
DOI
ISSN
0163-1829
Publication Date
May 1992
Volume
45
Issue
19
Start / End Page
11067 / 11084