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Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation

Publication ,  Journal Article
Prior, M; Makarovski, A; Finkelstein, G
Published in: Applied Physics Letters
August 10, 2007

The authors describe conductive tip atomic force microscope used for imaging carbon nanotubes at low temperatures. The instrument allows them to measure the tip-nanotube conductance while performing the topographic scan of the nanotubes on a nonconductive Si O2 substrate. For nanotubes weakly coupled to the contacting electrode, they observe the Coulomb blockade pattern in the tip-nanotube conductance. They reversibly modified the conductance pattern by applying the tip pressure. © 2007 American Institute of Physics.

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Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

August 10, 2007

Volume

91

Issue

5

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Prior, M., Makarovski, A., & Finkelstein, G. (2007). Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation. Applied Physics Letters, 91(5). https://doi.org/10.1063/1.2759986
Prior, M., A. Makarovski, and G. Finkelstein. “Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation.” Applied Physics Letters 91, no. 5 (August 10, 2007). https://doi.org/10.1063/1.2759986.
Prior M, Makarovski A, Finkelstein G. Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation. Applied Physics Letters. 2007 Aug 10;91(5).
Prior, M., et al. “Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation.” Applied Physics Letters, vol. 91, no. 5, Aug. 2007. Scopus, doi:10.1063/1.2759986.
Prior M, Makarovski A, Finkelstein G. Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation. Applied Physics Letters. 2007 Aug 10;91(5).

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

August 10, 2007

Volume

91

Issue

5

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences