Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation
Publication
, Journal Article
Prior, M; Makarovski, A; Finkelstein, G
Published in: Applied Physics Letters
August 10, 2007
The authors describe conductive tip atomic force microscope used for imaging carbon nanotubes at low temperatures. The instrument allows them to measure the tip-nanotube conductance while performing the topographic scan of the nanotubes on a nonconductive Si O2 substrate. For nanotubes weakly coupled to the contacting electrode, they observe the Coulomb blockade pattern in the tip-nanotube conductance. They reversibly modified the conductance pattern by applying the tip pressure. © 2007 American Institute of Physics.
Duke Scholars
Published In
Applied Physics Letters
DOI
ISSN
0003-6951
Publication Date
August 10, 2007
Volume
91
Issue
5
Related Subject Headings
- Applied Physics
- 51 Physical sciences
- 40 Engineering
- 10 Technology
- 09 Engineering
- 02 Physical Sciences
Citation
APA
Chicago
ICMJE
MLA
NLM
Prior, M., Makarovski, A., & Finkelstein, G. (2007). Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation. Applied Physics Letters, 91(5). https://doi.org/10.1063/1.2759986
Prior, M., A. Makarovski, and G. Finkelstein. “Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation.” Applied Physics Letters 91, no. 5 (August 10, 2007). https://doi.org/10.1063/1.2759986.
Prior M, Makarovski A, Finkelstein G. Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation. Applied Physics Letters. 2007 Aug 10;91(5).
Prior, M., et al. “Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation.” Applied Physics Letters, vol. 91, no. 5, Aug. 2007. Scopus, doi:10.1063/1.2759986.
Prior M, Makarovski A, Finkelstein G. Low-temperature conductive tip atomic force microscope for carbon nanotube probing and manipulation. Applied Physics Letters. 2007 Aug 10;91(5).
Published In
Applied Physics Letters
DOI
ISSN
0003-6951
Publication Date
August 10, 2007
Volume
91
Issue
5
Related Subject Headings
- Applied Physics
- 51 Physical sciences
- 40 Engineering
- 10 Technology
- 09 Engineering
- 02 Physical Sciences