Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities
Publication
, Journal Article
Cina, J; Carin, L
Published in: IEEE MTT-S International Microwave Symposium Digest
January 1, 1995
The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.
Duke Scholars
Published In
IEEE MTT-S International Microwave Symposium Digest
ISSN
0149-645X
Publication Date
January 1, 1995
Volume
1
Start / End Page
225 / 228
Citation
APA
Chicago
ICMJE
MLA
NLM
Cina, J., & Carin, L. (1995). Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities. IEEE MTT-S International Microwave Symposium Digest, 1, 225–228.
Cina, J., and L. Carin. “Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities.” IEEE MTT-S International Microwave Symposium Digest 1 (January 1, 1995): 225–28.
Cina J, Carin L. Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities. IEEE MTT-S International Microwave Symposium Digest. 1995 Jan 1;1:225–8.
Cina, J., and L. Carin. “Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities.” IEEE MTT-S International Microwave Symposium Digest, vol. 1, Jan. 1995, pp. 225–28.
Cina J, Carin L. Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities. IEEE MTT-S International Microwave Symposium Digest. 1995 Jan 1;1:225–228.
Published In
IEEE MTT-S International Microwave Symposium Digest
ISSN
0149-645X
Publication Date
January 1, 1995
Volume
1
Start / End Page
225 / 228