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Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities

Publication ,  Journal Article
Cina, J; Carin, L
Published in: IEEE MTT-S International Microwave Symposium Digest
January 1, 1995

The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.

Duke Scholars

Published In

IEEE MTT-S International Microwave Symposium Digest

ISSN

0149-645X

Publication Date

January 1, 1995

Volume

1

Start / End Page

225 / 228
 

Citation

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ICMJE
MLA
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Cina, J., & Carin, L. (1995). Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities. IEEE MTT-S International Microwave Symposium Digest, 1, 225–228.
Cina, J., and L. Carin. “Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities.” IEEE MTT-S International Microwave Symposium Digest 1 (January 1, 1995): 225–28.
Cina J, Carin L. Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities. IEEE MTT-S International Microwave Symposium Digest. 1995 Jan 1;1:225–8.
Cina, J., and L. Carin. “Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities.” IEEE MTT-S International Microwave Symposium Digest, vol. 1, Jan. 1995, pp. 225–28.
Cina J, Carin L. Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities. IEEE MTT-S International Microwave Symposium Digest. 1995 Jan 1;1:225–228.

Published In

IEEE MTT-S International Microwave Symposium Digest

ISSN

0149-645X

Publication Date

January 1, 1995

Volume

1

Start / End Page

225 / 228