Leakage effects in broadside-coupled microstrip
Publication
, Journal Article
Carin, L
Published in: IEEE MTT-S International Microwave Symposium Digest
December 1, 1991
Broadside-coupled microstrip with and without conducting side walls is studied using a full-wave spectral-domain analysis. Special attention is directed towards possible leakage to the parallel plate mode and its potential effects in practical integrated circuits. It is asserted that for certain geometrical parameters, broadside-coupled microstrip can be leaky at all frequencies. Comparisons between the modes on broadside-coupled microstrip with and without side walls are made by means of dispersion curves.
Duke Scholars
Published In
IEEE MTT-S International Microwave Symposium Digest
ISSN
0149-645X
Publication Date
December 1, 1991
Volume
2
Start / End Page
559 / 562
Citation
APA
Chicago
ICMJE
MLA
NLM
Carin, L. (1991). Leakage effects in broadside-coupled microstrip. IEEE MTT-S International Microwave Symposium Digest, 2, 559–562.
Carin, L. “Leakage effects in broadside-coupled microstrip.” IEEE MTT-S International Microwave Symposium Digest 2 (December 1, 1991): 559–62.
Carin L. Leakage effects in broadside-coupled microstrip. IEEE MTT-S International Microwave Symposium Digest. 1991 Dec 1;2:559–62.
Carin, L. “Leakage effects in broadside-coupled microstrip.” IEEE MTT-S International Microwave Symposium Digest, vol. 2, Dec. 1991, pp. 559–62.
Carin L. Leakage effects in broadside-coupled microstrip. IEEE MTT-S International Microwave Symposium Digest. 1991 Dec 1;2:559–562.
Published In
IEEE MTT-S International Microwave Symposium Digest
ISSN
0149-645X
Publication Date
December 1, 1991
Volume
2
Start / End Page
559 / 562