Simple method of obtaining Si(Li) detector efficiency
Publication
, Journal Article
Johnson, GA; Manson, EL; O'Foghludha, F
Published in: Nuclear Instruments and Methods
May 1, 1978
The efficiency of a semi-conductor detector is measured by compairing its response with that of an NaI(Tl) detector of known efficiency when both are exposed to the same flux of gamma-excited fluorescent X-rays. The experimental procedure is outlined and corrections and limitations are discussed. The technique is an inexpensive and convenient way of determining semi-conductor efficiency up to about 100 keV using a single radionuclide source of modest activity and readily-available fluorescers. © 1978.
Duke Scholars
Published In
Nuclear Instruments and Methods
DOI
ISSN
0029-554X
Publication Date
May 1, 1978
Volume
151
Issue
1-2
Start / End Page
217 / 220
Citation
APA
Chicago
ICMJE
MLA
NLM
Johnson, G. A., Manson, E. L., & O’Foghludha, F. (1978). Simple method of obtaining Si(Li) detector efficiency. Nuclear Instruments and Methods, 151(1–2), 217–220. https://doi.org/10.1016/0029-554X(78)90491-3
Johnson, G. A., E. L. Manson, and F. O’Foghludha. “Simple method of obtaining Si(Li) detector efficiency.” Nuclear Instruments and Methods 151, no. 1–2 (May 1, 1978): 217–20. https://doi.org/10.1016/0029-554X(78)90491-3.
Johnson GA, Manson EL, O’Foghludha F. Simple method of obtaining Si(Li) detector efficiency. Nuclear Instruments and Methods. 1978 May 1;151(1–2):217–20.
Johnson, G. A., et al. “Simple method of obtaining Si(Li) detector efficiency.” Nuclear Instruments and Methods, vol. 151, no. 1–2, May 1978, pp. 217–20. Scopus, doi:10.1016/0029-554X(78)90491-3.
Johnson GA, Manson EL, O’Foghludha F. Simple method of obtaining Si(Li) detector efficiency. Nuclear Instruments and Methods. 1978 May 1;151(1–2):217–220.
Published In
Nuclear Instruments and Methods
DOI
ISSN
0029-554X
Publication Date
May 1, 1978
Volume
151
Issue
1-2
Start / End Page
217 / 220