Defect coverage-driven window-based test compression
Publication
, Journal Article
Kavousianos, X; Chakrabarty, K; Kalligeros, E; Tenentes, V
Published in: Proceedings of the Asian Test Symposium
December 1, 2010
Although LFSR reseeding based on test cubes for modeled faults is an efficient test compression approach, it suffers from the drawback of limited, and often unpredictable, coverage of unmodeled defects. We present a new defect coverage-driven window-based LFSR reseeding technique, which offers both high test quality and high compression. The efficiency of the proposed encoding technique in detecting defects is boosted by an efficient "output deviations" metric for grading the calculated LFSR seeds. We show that, compared to standard compression-driven LFSR reseeding, higher defect coverage is obtained without any loss of compression. © 2010 IEEE.
Published In
Proceedings of the Asian Test Symposium
DOI
ISSN
1081-7735
Publication Date
December 1, 2010
Start / End Page
141 / 146
Citation
APA
Chicago
ICMJE
MLA
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Kavousianos, X., Chakrabarty, K., Kalligeros, E., & Tenentes, V. (2010). Defect coverage-driven window-based test compression. Proceedings of the Asian Test Symposium, 141–146. https://doi.org/10.1109/ATS.2010.33
Kavousianos, X., K. Chakrabarty, E. Kalligeros, and V. Tenentes. “Defect coverage-driven window-based test compression.” Proceedings of the Asian Test Symposium, December 1, 2010, 141–46. https://doi.org/10.1109/ATS.2010.33.
Kavousianos X, Chakrabarty K, Kalligeros E, Tenentes V. Defect coverage-driven window-based test compression. Proceedings of the Asian Test Symposium. 2010 Dec 1;141–6.
Kavousianos, X., et al. “Defect coverage-driven window-based test compression.” Proceedings of the Asian Test Symposium, Dec. 2010, pp. 141–46. Scopus, doi:10.1109/ATS.2010.33.
Kavousianos X, Chakrabarty K, Kalligeros E, Tenentes V. Defect coverage-driven window-based test compression. Proceedings of the Asian Test Symposium. 2010 Dec 1;141–146.
Published In
Proceedings of the Asian Test Symposium
DOI
ISSN
1081-7735
Publication Date
December 1, 2010
Start / End Page
141 / 146