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System-on-a-chip test-data compression and decompression architectures based on Golomb codes

Publication ,  Journal Article
Chandra, A; Chakrabarty, K
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
March 1, 2001

We present a new test-data compression method and decompression architecture based on variable-to-variable-length Golomb codes. The proposed method is especially suitable for encoding precomputed test sets for embedded cores in a system-on-a-chip (SoC). The major advantages of Golomb coding of test data include very high compression, analytically predictable compression results, and a low-cost and scalable on-chip decoder. In addition, the novel interleaving decompression architecture allows multiple cores in an SoC to be tested concurrently using a single automatic test equipment input-output channel. We demonstrate the effectiveness of the proposed approach by applying it to the Internaional Symposium on Circuits and Systems' benchmark circuits and to two industrial production circuits. We also use analytical and experimental means to highlight the superiority of Golomb codes over run-length codes.

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Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

ISSN

0278-0070

Publication Date

March 1, 2001

Volume

20

Issue

3

Start / End Page

355 / 368

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering
 

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Chandra, A., & Chakrabarty, K. (2001). System-on-a-chip test-data compression and decompression architectures based on Golomb codes. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 20(3), 355–368. https://doi.org/10.1109/43.913754
Chandra, A., and K. Chakrabarty. “System-on-a-chip test-data compression and decompression architectures based on Golomb codes.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 20, no. 3 (March 1, 2001): 355–68. https://doi.org/10.1109/43.913754.
Chandra A, Chakrabarty K. System-on-a-chip test-data compression and decompression architectures based on Golomb codes. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2001 Mar 1;20(3):355–68.
Chandra, A., and K. Chakrabarty. “System-on-a-chip test-data compression and decompression architectures based on Golomb codes.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 20, no. 3, Mar. 2001, pp. 355–68. Scopus, doi:10.1109/43.913754.
Chandra A, Chakrabarty K. System-on-a-chip test-data compression and decompression architectures based on Golomb codes. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2001 Mar 1;20(3):355–368.

Published In

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI

ISSN

0278-0070

Publication Date

March 1, 2001

Volume

20

Issue

3

Start / End Page

355 / 368

Related Subject Headings

  • Computer Hardware & Architecture
  • 4607 Graphics, augmented reality and games
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0906 Electrical and Electronic Engineering