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Science and law. View from the bench: patents and material transfers.

Publication ,  Journal Article
Walsh, JP; Cho, C; Cohen, WM
Published in: Science (New York, N.Y.)
September 2005
Published version (DOI)

Duke Scholars

Wesley M. Cohen
Author Wesley M. Cohen Fuqua School of Business
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Published In

Science (New York, N.Y.)

DOI

10.1126/science.1115813

EISSN

1095-9203

ISSN

0036-8075

Publication Date

September 2005

Volume

309

Issue

5743

Start / End Page

2002 / 2003

Related Subject Headings

  • United States
  • Technology Transfer
  • Surveys and Questionnaires
  • Research Support as Topic
  • Research Personnel
  • Regression Analysis
  • Patents as Topic
  • Intellectual Property
  • General Science & Technology
  • Costs and Cost Analysis
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Walsh, J. P., Cho, C., & Cohen, W. M. (2005). Science and law. View from the bench: patents and material transfers. Science (New York, N.Y.), 309(5743), 2002–2003. https://doi.org/10.1126/science.1115813
Walsh, John P., Charlene Cho, and Wesley M. Cohen. “Science and law. View from the bench: patents and material transfers.” Science (New York, N.Y.) 309, no. 5743 (September 2005): 2002–3. https://doi.org/10.1126/science.1115813.
Walsh JP, Cho C, Cohen WM. Science and law. View from the bench: patents and material transfers. Science (New York, NY). 2005 Sep;309(5743):2002–3.
Walsh, John P., et al. “Science and law. View from the bench: patents and material transfers.” Science (New York, N.Y.), vol. 309, no. 5743, Sept. 2005, pp. 2002–03. Epmc, doi:10.1126/science.1115813.
Walsh JP, Cho C, Cohen WM. Science and law. View from the bench: patents and material transfers. Science (New York, NY). 2005 Sep;309(5743):2002–2003.
Journal cover image

Published In

Science (New York, N.Y.)

DOI

10.1126/science.1115813

EISSN

1095-9203

ISSN

0036-8075

Publication Date

September 2005

Volume

309

Issue

5743

Start / End Page

2002 / 2003

Related Subject Headings

  • United States
  • Technology Transfer
  • Surveys and Questionnaires
  • Research Support as Topic
  • Research Personnel
  • Regression Analysis
  • Patents as Topic
  • Intellectual Property
  • General Science & Technology
  • Costs and Cost Analysis