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A semianalytical spectral element method for the analysis of 3-D layered structures

Publication ,  Journal Article
Chen, J; Zhu, B; Zhong, W; Liu, QH
Published in: IEEE Transactions on Microwave Theory and Techniques
January 1, 2011

A semianalytical spectral element method (SEM) is proposed for electromagnetic simulations of 3-D layered structures. 2-D spectral elements are employed to discretize the cross section of a layered structure, and the Legendre transformation is then used to cast the semidiscretized problem from the Lagrangian system into the Hamiltonian system. A Riccati equation-based high precision integration method is utilized to perform integration along the longitudinal direction, which is the undiscretized direction, to generate the stiffness matrix of the whole layered structure. The final system of equations by the semianalytical SEM will take the form of a set of linear equations with a block tri-diagonal matrix, which can be solved efficiently by the block Thomas algorithm. Numerical examples demonstrate the high efficiency and accuracy of the proposed method. © 2010 IEEE.

Published In

IEEE Transactions on Microwave Theory and Techniques

DOI

ISSN

0018-9480

Publication Date

January 1, 2011

Volume

59

Issue

1

Start / End Page

1 / 8

Related Subject Headings

  • Networking & Telecommunications
  • 5103 Classical physics
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering
 

Citation

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Chen, J., Zhu, B., Zhong, W., & Liu, Q. H. (2011). A semianalytical spectral element method for the analysis of 3-D layered structures. IEEE Transactions on Microwave Theory and Techniques, 59(1), 1–8. https://doi.org/10.1109/TMTT.2010.2090408
Chen, J., B. Zhu, W. Zhong, and Q. H. Liu. “A semianalytical spectral element method for the analysis of 3-D layered structures.” IEEE Transactions on Microwave Theory and Techniques 59, no. 1 (January 1, 2011): 1–8. https://doi.org/10.1109/TMTT.2010.2090408.
Chen J, Zhu B, Zhong W, Liu QH. A semianalytical spectral element method for the analysis of 3-D layered structures. IEEE Transactions on Microwave Theory and Techniques. 2011 Jan 1;59(1):1–8.
Chen, J., et al. “A semianalytical spectral element method for the analysis of 3-D layered structures.” IEEE Transactions on Microwave Theory and Techniques, vol. 59, no. 1, Jan. 2011, pp. 1–8. Scopus, doi:10.1109/TMTT.2010.2090408.
Chen J, Zhu B, Zhong W, Liu QH. A semianalytical spectral element method for the analysis of 3-D layered structures. IEEE Transactions on Microwave Theory and Techniques. 2011 Jan 1;59(1):1–8.

Published In

IEEE Transactions on Microwave Theory and Techniques

DOI

ISSN

0018-9480

Publication Date

January 1, 2011

Volume

59

Issue

1

Start / End Page

1 / 8

Related Subject Headings

  • Networking & Telecommunications
  • 5103 Classical physics
  • 1005 Communications Technologies
  • 0906 Electrical and Electronic Engineering