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Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs

Publication ,  Journal Article
Reichert, W; Cohen, RM
Published in: Journal of Electronic Materials
January 1, 2000

Organometallic vapor phase epitaxial growth of GaAs on 320 nm high mesas was used to study the dependence of lateral growth upon the substrate misorientation from (100) and the mesa wall orientation on the substrate. GaAs (100) substrates were misoriented by 3° toward eight major crystallographic directions, consisting of the four nearest [111] and [110] directions. The mesa sidewalls were oriented either parallel to the 〈011〉 and 〈011̄〉 directions or rotated by 45° to be parallel to the 〈001〉 and 〈010〉 directions. GaAs films were grown with TMGa and TBA at T = 575 °C. The lateral growth rates were up to 25 times higher than the vertical growth rate of 1.3 μm/hour. Optical microscopy and atomic force microscopy (AFM) showed that under the given growth conditions lateral growth off mesa sidewalls is most rapid in the 〈011〉 and/or 〈01̄1̄〉 directions and less in the perpendicular 〈011̄〉 and 〈01̄1〉 directions (lateral growth anisotropy). By raising the temperature to 625 °C lateral growth in the 〈011̄〉-〈01̄1〉 directions increased while it remained almost constant in the 〈011〉-〈01̄1̄〉 directions. Published results show that the partial pressure of As also affects lateral growth. Differences in the lateral growth rates in the 〈011〉 and its opposite 〈01̄1̄〉 directions result from substrate misorientation but not from the orientation of the mesa walls on the substrate. Anisotropic lateral growth rates in different crystallographic directions appear to be caused by both, (1) 1-dimensional Ga diffusion defined by surface reconstruction, and (2) a relatively low energy barrier to atoms flowing over high-to-low terrace steps. A lateral growth model is proposed that describes anisotropic lateral growth at mesa sidewalls in terms of growth conditions and substrate misorientations. The model also explains the difference in the preferential lateral growth directions between MBE and OMVPE.

Duke Scholars

Published In

Journal of Electronic Materials

DOI

ISSN

0361-5235

Publication Date

January 1, 2000

Volume

29

Issue

1

Start / End Page

118 / 128

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 34 Chemical sciences
  • 1099 Other Technology
  • 0906 Electrical and Electronic Engineering
  • 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
 

Citation

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Reichert, W., & Cohen, R. M. (2000). Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs. Journal of Electronic Materials, 29(1), 118–128. https://doi.org/10.1007/s11664-000-0106-4
Reichert, W., and R. M. Cohen. “Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs.” Journal of Electronic Materials 29, no. 1 (January 1, 2000): 118–28. https://doi.org/10.1007/s11664-000-0106-4.
Reichert W, Cohen RM. Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs. Journal of Electronic Materials. 2000 Jan 1;29(1):118–28.
Reichert, W., and R. M. Cohen. “Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs.” Journal of Electronic Materials, vol. 29, no. 1, Jan. 2000, pp. 118–28. Scopus, doi:10.1007/s11664-000-0106-4.
Reichert W, Cohen RM. Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs. Journal of Electronic Materials. 2000 Jan 1;29(1):118–128.
Journal cover image

Published In

Journal of Electronic Materials

DOI

ISSN

0361-5235

Publication Date

January 1, 2000

Volume

29

Issue

1

Start / End Page

118 / 128

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 34 Chemical sciences
  • 1099 Other Technology
  • 0906 Electrical and Electronic Engineering
  • 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics