Skip to main content
Journal cover image

A unified performance reliability analysis of a system with a cumulative down time constraint

Publication ,  Journal Article
Nicola, V; Bobbio, A; Trivedi, K
Published in: Microelectronics Reliability
January 1, 1992

We discuss unified performance and reliability analysis of a system which operates in a critical environment, in the sense that a catastrophic condition is reached when the accumulated down time exceeds a given threshold. Assuming that the system must process a task with a specified work requirement, we evaluate the probability that the task will be completed at a given time before the system reaches the catastrophic state. We show that several other important measures (like the distribution of the lifetime, the distribution of the interval availability, and the instantaneous availability) can be derived from the knowledge of the distribution of the completion time. A numerical example, based on the use of Phase (PH) type distributed random variables, concludes the paper. © 1991.

Duke Scholars

Published In

Microelectronics Reliability

DOI

ISSN

0026-2714

Publication Date

January 1, 1992

Volume

32

Issue

1-2

Start / End Page

49 / 65

Related Subject Headings

  • Applied Physics
  • 4009 Electronics, sensors and digital hardware
  • 0906 Electrical and Electronic Engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Nicola, V., Bobbio, A., & Trivedi, K. (1992). A unified performance reliability analysis of a system with a cumulative down time constraint. Microelectronics Reliability, 32(1–2), 49–65. https://doi.org/10.1016/0026-2714(92)90086-Z
Nicola, V., A. Bobbio, and K. Trivedi. “A unified performance reliability analysis of a system with a cumulative down time constraint.” Microelectronics Reliability 32, no. 1–2 (January 1, 1992): 49–65. https://doi.org/10.1016/0026-2714(92)90086-Z.
Nicola V, Bobbio A, Trivedi K. A unified performance reliability analysis of a system with a cumulative down time constraint. Microelectronics Reliability. 1992 Jan 1;32(1–2):49–65.
Nicola, V., et al. “A unified performance reliability analysis of a system with a cumulative down time constraint.” Microelectronics Reliability, vol. 32, no. 1–2, Jan. 1992, pp. 49–65. Scopus, doi:10.1016/0026-2714(92)90086-Z.
Nicola V, Bobbio A, Trivedi K. A unified performance reliability analysis of a system with a cumulative down time constraint. Microelectronics Reliability. 1992 Jan 1;32(1–2):49–65.
Journal cover image

Published In

Microelectronics Reliability

DOI

ISSN

0026-2714

Publication Date

January 1, 1992

Volume

32

Issue

1-2

Start / End Page

49 / 65

Related Subject Headings

  • Applied Physics
  • 4009 Electronics, sensors and digital hardware
  • 0906 Electrical and Electronic Engineering