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Methodology for thermal aware topologies and partitioning with better lateral spreading

Publication ,  Journal Article
Agrawal, P; Kalangi, VP; Kumar, MA; Srinivasa, R; Pal, A
Published in: Proceedings of the International Conference on Microelectronics, ICM
2008

As the temperature became a first class design metric due to increased power densities, one of the key challenges in deep sub-micron technologies is to guarantee thermal safety while minimizing the performance impact. This highlights the need for thermal-aware physical design methodologies. In this paper we propose a practical methodology to improve lateral heat spreading by altering partitions and floorplan based on thermal hotspots obtained through dynamic simulations, at Thermal Design Power conditions, without impacting timing and area. It also preserves the legacy and critical interfaces besides ensuring not to create new backend design issues - critical in case of proliferated designs. The xperiments have been carried out using a complex mobile chipset. © 2008 IEEE.

Duke Scholars

Published In

Proceedings of the International Conference on Microelectronics, ICM

DOI

Publication Date

2008

Start / End Page

171 / 174
 

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Agrawal, P., Kalangi, V. P., Kumar, M. A., Srinivasa, R., & Pal, A. (2008). Methodology for thermal aware topologies and partitioning with better lateral spreading. Proceedings of the International Conference on Microelectronics, ICM, 171–174. https://doi.org/10.1109/ICM.2008.5393526
Agrawal, P., V. P. Kalangi, M. A. Kumar, R. Srinivasa, and A. Pal. “Methodology for thermal aware topologies and partitioning with better lateral spreading.” Proceedings of the International Conference on Microelectronics, ICM, 2008, 171–74. https://doi.org/10.1109/ICM.2008.5393526.
Agrawal P, Kalangi VP, Kumar MA, Srinivasa R, Pal A. Methodology for thermal aware topologies and partitioning with better lateral spreading. Proceedings of the International Conference on Microelectronics, ICM. 2008;171–4.
Agrawal, P., et al. “Methodology for thermal aware topologies and partitioning with better lateral spreading.” Proceedings of the International Conference on Microelectronics, ICM, 2008, pp. 171–74. Scival, doi:10.1109/ICM.2008.5393526.
Agrawal P, Kalangi VP, Kumar MA, Srinivasa R, Pal A. Methodology for thermal aware topologies and partitioning with better lateral spreading. Proceedings of the International Conference on Microelectronics, ICM. 2008;171–174.

Published In

Proceedings of the International Conference on Microelectronics, ICM

DOI

Publication Date

2008

Start / End Page

171 / 174