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Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells

Publication ,  Journal Article
Özgür, U; Bergmann, MJ; Casey, HC; Everitt, HO; Abare, AC; Keller, S; DenBaars, SP
Published in: Applied Physics Letters
July 3, 2000

Subpicosecond wavelength-degenerate differential transmission optical spectroscopy was used to characterize the electron capture time in a 10-period InxGa1-xN multiple-quantum-well (MQW) structure. Photoluminescence and photoluminescence excitation spectroscopies demonstrated enhanced MQW emission for injection within ±50 meV of the barrier energy. Time-resolved differential transmission measurements for excitation in this region reveal efficient electron capture in the quantum wells with a time constant between 310 and 540 fs. A slower exponential relaxation, with strongly wavelength-dependent subnanosecond decay constants, is also observed. © 2000 American Institute of Physics.

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

July 3, 2000

Volume

77

Issue

1

Start / End Page

109 / 111

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Özgür, U., Bergmann, M. J., Casey, H. C., Everitt, H. O., Abare, A. C., Keller, S., & DenBaars, S. P. (2000). Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells. Applied Physics Letters, 77(1), 109–111. https://doi.org/10.1063/1.126893
Özgür, U., M. J. Bergmann, H. C. Casey, H. O. Everitt, A. C. Abare, S. Keller, and S. P. DenBaars. “Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells.” Applied Physics Letters 77, no. 1 (July 3, 2000): 109–11. https://doi.org/10.1063/1.126893.
Özgür U, Bergmann MJ, Casey HC, Everitt HO, Abare AC, Keller S, et al. Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells. Applied Physics Letters. 2000 Jul 3;77(1):109–11.
Özgür, U., et al. “Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells.” Applied Physics Letters, vol. 77, no. 1, July 2000, pp. 109–11. Scopus, doi:10.1063/1.126893.
Özgür U, Bergmann MJ, Casey HC, Everitt HO, Abare AC, Keller S, DenBaars SP. Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells. Applied Physics Letters. 2000 Jul 3;77(1):109–111.

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

July 3, 2000

Volume

77

Issue

1

Start / End Page

109 / 111

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences