Skip to main content
Journal cover image

Characterization of colloidal quantum dot ligand exchange by X-ray photoelectron spectroscopy

Publication ,  Journal Article
Atewologun, A; Ge, W; Stiff-Roberts, AD
Published in: Journal of Electronic Materials
May 1, 2013

Colloidal quantum dots (CQDs) are chemically synthesized semiconductor nanoparticles with size-dependent wavelength tunability. Chemical synthesis of CQDs involves the attachment of long organic surface ligands to prevent aggregation; however, these ligands also impede charge transport. Therefore, it is beneficial to exchange longer surface ligands for shorter ones for optoelectronic devices. Typical characterization techniques used to analyze surface ligand exchange include Fourier-transform infrared spectroscopy, x-ray diffraction, transmission electron microscopy, and nuclear magnetic resonance spectroscopy, yet these techniques do not provide a simultaneously direct, quantitative, and sensitive method for evaluating surface ligands on CQDs. In contrast, x-ray photoelectron spectroscopy (XPS) can provide nanoscale sensitivity for quantitative analysis of CQD surface ligand exchange. A unique aspect of this work is that a fingerprint is identified for shorter surface ligands by resolving the regional XPS spectrum corresponding to different types of carbon bonds. In addition, a deposition technique known as resonant infrared matrix-assisted pulsed laser evaporation is used to improve the CQD film uniformity such that stronger XPS signals are obtained, enabling more accurate analysis of the ligand exchange process. © 2013 TMS.

Duke Scholars

Published In

Journal of Electronic Materials

DOI

ISSN

0361-5235

Publication Date

May 1, 2013

Volume

42

Issue

5

Start / End Page

809 / 814

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 34 Chemical sciences
  • 1099 Other Technology
  • 0906 Electrical and Electronic Engineering
  • 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Atewologun, A., Ge, W., & Stiff-Roberts, A. D. (2013). Characterization of colloidal quantum dot ligand exchange by X-ray photoelectron spectroscopy. Journal of Electronic Materials, 42(5), 809–814. https://doi.org/10.1007/s11664-012-2371-4
Atewologun, A., W. Ge, and A. D. Stiff-Roberts. “Characterization of colloidal quantum dot ligand exchange by X-ray photoelectron spectroscopy.” Journal of Electronic Materials 42, no. 5 (May 1, 2013): 809–14. https://doi.org/10.1007/s11664-012-2371-4.
Atewologun A, Ge W, Stiff-Roberts AD. Characterization of colloidal quantum dot ligand exchange by X-ray photoelectron spectroscopy. Journal of Electronic Materials. 2013 May 1;42(5):809–14.
Atewologun, A., et al. “Characterization of colloidal quantum dot ligand exchange by X-ray photoelectron spectroscopy.” Journal of Electronic Materials, vol. 42, no. 5, May 2013, pp. 809–14. Scopus, doi:10.1007/s11664-012-2371-4.
Atewologun A, Ge W, Stiff-Roberts AD. Characterization of colloidal quantum dot ligand exchange by X-ray photoelectron spectroscopy. Journal of Electronic Materials. 2013 May 1;42(5):809–814.
Journal cover image

Published In

Journal of Electronic Materials

DOI

ISSN

0361-5235

Publication Date

May 1, 2013

Volume

42

Issue

5

Start / End Page

809 / 814

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 34 Chemical sciences
  • 1099 Other Technology
  • 0906 Electrical and Electronic Engineering
  • 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics