Scholarly Works - Book sections
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January 1, 2023
The ever-increasing integration density and design complexity of printed-circuit boards are making functional fault diagnosis extremely challenging. The cost associated with the testing, diagnosis and repair is one of the highest contributors to board manu ...
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January 1, 2020
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January 1, 2019
In this chapter, we propose a new technique, referred to as virtual probe (VP), to efficiently measure, characterize, and monitor spatially correlated inter-die and/or intra-die variations in nanoscale manufacturing process. VP exploits recent breakthrough ...
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January 1, 2019
Accurately estimating the rare failure rates for nanoscale memory circuits is a challenging task, especially when the variation space is high-dimensional. In this chapter, we summarize two novel techniques to address this technical challenge. First, we des ...
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January 1, 2019
While design and implementation of autonomous and intelligent systems is not a new area, the recent advances in sensor, machine learning, and other software and hardware bring enormous opportunities as well as complexities in these systems, and they accomp ...
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January 1, 2019
Today’s automotive vehicles are often equipped with powerful data processing systems for driver assistance and/or autonomous driving. To meet the rigorous safety standard, ensuring extremely small failure probability over all possible operation conditions ...
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January 1, 2019
Machine learning is transforming many industries and areas of work, and the design of very large-scale integrated (VLSI) circuits and systems is no exception. The purpose of this book is to bring to the interested reader a cross-section of the connections ...
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January 1, 2019
In this chapter, we describe a novel statistical framework, referred to as Bayesian Model Fusion (BMF), that allows us to minimize the simulation and/or measurement cost for both pre-silicon validation and post-silicon tuning of analog and mixed-signal (AM ...
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January 1, 2016
Process variation is the most critical issue for the nanoscale analog and radiofrequency integrated circuits (ICs). There are many traditional techniques to mitigate the process variations problems which are mainly based on some form of static approach. Ho ...
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December 1, 2010
It has long been recognized that, apart from computational efficiency and accuracy of fitting experimental data, compact MOS transistor models should exhibit qualitatively correct physical behavior for drain current, terminal charges, noise, and all deriva ...
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December 1, 2010
We review surface-potential-based approach to compact modeling of bulk MOS transistors and provide introduction to the widely used PSP model jointly developed by the Arizona State University and NXP Semiconductors. The emphasis is on the interplay between ...
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https://orcid.org/0000-0002-4510-2436