Skip to main content

Hisham Z. Massoud

Professor Emeritus of Electrical and Computer Engineering
Pierre R. Lamond Department of Electrical and Computer Engineering
Box 90291, Dept of Elec and Comp Eng, Durham, NC 27708-0291
CIEMAS Building, Room 3521, Dept of Elec and Comp Eng, Durham, NC 27708-0291

Scholarly Works - Conferences


Integrating sensing and information processing in an electrical and computer engineering undergraduate curriculum

Conference Proceedings Frontiers in Education Conference Fie · December 1, 2009 The Department of Electrical and Computer Engineering Duke University has completed a full-scale redesign of its undergraduate program based on the theme of Integrated Sensing and Information Processing. This theme provides a coherent, overarching framewor ... Full text Cite

Design of a flexible RF data link and associated laboratory curriculum in a first analog electronics and devices course

Conference ASEE Annual Conference and Exposition Conference Proceedings · January 1, 2009 A flexible low cost digital RF/IR communication link is described with an accompanying curriculum. The construction of the data link is intended to provide a jumping off point for students to explore electronics in a design-oriented, project-based first el ... Cite

Redesign of the core curriculum at Duke University

Conference ASEE Annual Conference and Exposition, Conference Proceedings · December 1, 2006 Cite

Redesign of the core curriculum at Duke University

Conference ASEE Annual Conference and Exposition Conference Proceedings · January 1, 2006 Cite

Theme-based redesign of the duke university ECE curriculum: The first steps

Conference ASEE Annual Conference and Exposition, Conference Proceedings · 2005 Undergraduates in Electrical and Computer Engineering (ECE) at Duke University have benefited from the combination of curricular flexibility and rigorous coursework. The current curriculum is further limited in that the core courses do not offer a vertical ... Cite

Work in progress: Theme-based redesign of an electrical and computer engineering curriculum

Conference Proceedings Frontiers in Education Conference Fie · December 1, 2004 The goal of this work-in-progress is to develop an innovative ECE curriculum that focuses on ECE fundamentals within the construct of real-world integrated system design, analysis, and problem solving. The curriculum will be formulated around the theme of ... Cite

Comparison of valence-band tunneling in pure sio2, composite sio2/ta2o5, and pure ta2o5, in mosfets with 1.0 nm-thick sio2-equivalent gate dielectrics

Conference Materials Research Society Symposium Proceedings · January 1, 1999 The gate tunneling current in ultrathin gate dielectric NMOSFETs with positive gate bias is due to the tunneling of electrons from the conduction and valence bands of the substrate. Valence-band electrons tunnel from the substrate of NMOS devices when the ... Full text Cite

Dielectrics, interfaces, and epitaxy

Conference SILICON MATERIALS SCIENCE AND TECHNOLOGY, VOLS 1 AND 2 · January 1, 1998 Link to item Cite

Ellipsometry-based process monitoring and control for ultrathin gate dielectrics

Conference PROCEEDINGS OF THE SYMPOSIUM ON SILICON NITRIDE AND SILICON DIOXIDE THIN INSULATING FILMS · January 1, 1997 Link to item Cite

Wear-out and stress-induced leakage current of ultrathin gate oxides

Conference PHYSICS AND CHEMISTRY OF SIO(2) AND THE SI-SIO(2) INTERFACE-3, 1996 · 1996 Link to item Cite

DEPOSITION AND PROPERTIES OF SIO2 - INTRODUCTION

Conference PHYSICS AND CHEMISTRY OF SIO2 AND THE SI-SI0-2 INTERFACE 2 · January 1, 1993 Link to item Cite

RESPONSE-SURFACE ANALYSIS OF THE RAPID THERMAL-OXIDATION OF SILICON

Conference RAPID THERMAL AND INTEGRATED PROCESSING · 1991 Link to item Cite

Applications of In Situ Ellipsometry in RTP Temperature Measurement and Process Control

Conference MRS Proceedings · 1991 AbstractThe applications of in situ automated ellipsometry in the measurement and control of temperature in rapid-thermal processing (RTP) equipment are investigated. This technique relies on the ... Full text Cite