3D x-ray diffraction imaging of optically thin samples
Publication
, Conference
Gude, Z; Kapadia, AJ; Greenberg, JA
Published in: Proceedings of SPIE - The International Society for Optical Engineering
January 1, 2022
Understanding the material composition everywhere in a three-dimensional volume is important for medical, security, and material science applications. Using a fan beam geometry with detector-side coded aperture, we demonstrate fast, high-resolution 3D X-ray diffraction (XRD) imaging. The XRD imaging system has a 15 x 15 cm2 field of view with a spatial resolution of approximately 1x1.5x7 mm3 (width x length x depth), a fractional momentum transfer resolution of approximately 10%, and scan times on the order of 10 minutes. Using this system, we show the ability to differentiate between two similar-density organic materials (water and PLA) in 3D using conventional, off-The-shelf components.
Duke Scholars
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
January 1, 2022
Volume
12104
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Gude, Z., Kapadia, A. J., & Greenberg, J. A. (2022). 3D x-ray diffraction imaging of optically thin samples. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 12104). https://doi.org/10.1117/12.2618938
Gude, Z., A. J. Kapadia, and J. A. Greenberg. “3D x-ray diffraction imaging of optically thin samples.” In Proceedings of SPIE - The International Society for Optical Engineering, Vol. 12104, 2022. https://doi.org/10.1117/12.2618938.
Gude Z, Kapadia AJ, Greenberg JA. 3D x-ray diffraction imaging of optically thin samples. In: Proceedings of SPIE - The International Society for Optical Engineering. 2022.
Gude, Z., et al. “3D x-ray diffraction imaging of optically thin samples.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 12104, 2022. Scopus, doi:10.1117/12.2618938.
Gude Z, Kapadia AJ, Greenberg JA. 3D x-ray diffraction imaging of optically thin samples. Proceedings of SPIE - The International Society for Optical Engineering. 2022.
Published In
Proceedings of SPIE - The International Society for Optical Engineering
DOI
EISSN
1996-756X
ISSN
0277-786X
Publication Date
January 1, 2022
Volume
12104
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering