Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells
Journal articles
Yacobi, BG; McMahon, TJ; Madan, A
Published in: Solar Cells
August 1984
Duke Scholars
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Published In
Solar Cells
DOI
ISSN
0379-6787
Publication Date
August 1984
Volume
12
Issue
3
Start / End Page
329 / 335
Publisher
Elsevier BV
Citation
APA
Chicago
ICMJE
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Yacobi, B. G., McMahon, T. J., & Madan, A. (1984). Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells. Solar Cells, 12(3), 329–335. https://doi.org/10.1016/0379-6787(84)90111-x
Yacobi, B. G., T. J. McMahon, and A. Madan. “Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells.” Solar Cells 12, no. 3 (August 1984): 329–35. https://doi.org/10.1016/0379-6787(84)90111-x.
Yacobi BG, McMahon TJ, Madan A. Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells. Solar Cells. 1984 Aug;12(3):329–35.
Yacobi, B. G., et al. “Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells.” Solar Cells, vol. 12, no. 3, Elsevier BV, Aug. 1984, pp. 329–35. Crossref, doi:10.1016/0379-6787(84)90111-x.
Yacobi BG, McMahon TJ, Madan A. Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells. Solar Cells. Elsevier BV; 1984 Aug;12(3):329–335.
Published In
Solar Cells
DOI
ISSN
0379-6787
Publication Date
August 1984
Volume
12
Issue
3
Start / End Page
329 / 335
Publisher
Elsevier BV