Deviation from expected cognitive ability across psychotic disorders.

Published

Journal Article

Patients with schizophrenia show a deficit in cognitive ability compared to estimated premorbid and familial intellectual abilities. However, the degree to which this pattern holds across psychotic disorders and is familial is unclear. The present study examined deviation from expected cognitive level in schizophrenia, schizoaffective disorder, and psychotic bipolar disorder probands and their first-degree relatives. Using a norm-based regression approach, parental education and WRAT-IV Reading scores (both significant predictors of cognitive level in the healthy control group) were used to predict global neuropsychological function as measured by the composite score from the Brief Assessment of Cognition in Schizophrenia (BACS) test in probands and relatives. When compared to healthy control group, psychotic probands showed a significant gap between observed and predicted BACS composite scores and a greater likelihood of robust cognitive decline. This effect was not seen in unaffected relatives. While BACS and WRAT-IV Reading scores were themselves highly familial, the decline in cognitive function from expectation had lower estimates of familiality. Thus, illness-related factors such as epigenetic, treatment, or pathophysiological factors may be important causes of illness related decline in cognitive abilities across psychotic disorders. This is consistent with the markedly greater level of cognitive impairment seen in affected individuals compared to their unaffected family members.

Full Text

Duke Authors

Cited Authors

  • Hochberger, WC; Combs, T; Reilly, JL; Bishop, JR; Keefe, RSE; Clementz, BA; Keshavan, MS; Pearlson, GD; Tamminga, CA; Hill, SK; Sweeney, JA

Published Date

  • February 2018

Published In

Volume / Issue

  • 192 /

Start / End Page

  • 300 - 307

PubMed ID

  • 28545944

Pubmed Central ID

  • 28545944

Electronic International Standard Serial Number (EISSN)

  • 1573-2509

Digital Object Identifier (DOI)

  • 10.1016/j.schres.2017.05.019

Language

  • eng

Conference Location

  • Netherlands