Gated decap: Gate leakage control of on-chip decoupling capacitors in scaled technologies
Publication
, Conference
Chen, YR; Li, H; Roy, K; Koh, CK
Published in: CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE
January 1, 2005
Duke Scholars
Published In
CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE
ISBN
0-7803-9023-7
Publication Date
January 1, 2005
Start / End Page
775 / 778
Location
San Jose, CA
Publisher
IEEE
Conference Name
IEEE Custom Integrated Circuits Conference
Citation
APA
Chicago
ICMJE
MLA
NLM
Chen, Y. R., Li, H., Roy, K., & Koh, C. K. (2005). Gated decap: Gate leakage control of on-chip decoupling capacitors in scaled technologies. In CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE (pp. 775–778). San Jose, CA: IEEE.
Chen, Y. R., H. Li, K. Roy, and C. K. Koh. “Gated decap: Gate leakage control of on-chip decoupling capacitors in scaled technologies.” In CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 775–78. IEEE, 2005.
Chen YR, Li H, Roy K, Koh CK. Gated decap: Gate leakage control of on-chip decoupling capacitors in scaled technologies. In: CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE. IEEE; 2005. p. 775–8.
Chen, Y. R., et al. “Gated decap: Gate leakage control of on-chip decoupling capacitors in scaled technologies.” CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE, IEEE, 2005, pp. 775–78.
Chen YR, Li H, Roy K, Koh CK. Gated decap: Gate leakage control of on-chip decoupling capacitors in scaled technologies. CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE. IEEE; 2005. p. 775–778.
Published In
CICC: PROCEEDINGS OF THE IEEE 2005 CUSTOM INTEGRATED CIRCUITS CONFERENCE
ISBN
0-7803-9023-7
Publication Date
January 1, 2005
Start / End Page
775 / 778
Location
San Jose, CA
Publisher
IEEE
Conference Name
IEEE Custom Integrated Circuits Conference