Universal Statistical Cure For Predicting Memory Loss (Invited Paper)
Publication
, Conference
Joshi, R; Kanj, R; Wang, P; Li, HH
Published in: 2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)
January 1, 2011
Duke Scholars
Published In
2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)
ISSN
1933-7760
Publication Date
January 1, 2011
Start / End Page
236 / 239
Location
San Jose, CA
Publisher
IEEE
Conference Name
IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
Citation
APA
Chicago
ICMJE
MLA
NLM
Joshi, R., Kanj, R., Wang, P., & Li, H. H. (2011). Universal Statistical Cure For Predicting Memory Loss (Invited Paper). In 2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) (pp. 236–239). San Jose, CA: IEEE.
Joshi, Rajiv, Rouwaida Kanj, Peiyuan Wang, and Hai Helen Li. “Universal Statistical Cure For Predicting Memory Loss (Invited Paper).” In 2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 236–39. IEEE, 2011.
Joshi R, Kanj R, Wang P, Li HH. Universal Statistical Cure For Predicting Memory Loss (Invited Paper). In: 2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD). IEEE; 2011. p. 236–9.
Joshi, Rajiv, et al. “Universal Statistical Cure For Predicting Memory Loss (Invited Paper).” 2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), IEEE, 2011, pp. 236–39.
Joshi R, Kanj R, Wang P, Li HH. Universal Statistical Cure For Predicting Memory Loss (Invited Paper). 2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD). IEEE; 2011. p. 236–239.
Published In
2011 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)
ISSN
1933-7760
Publication Date
January 1, 2011
Start / End Page
236 / 239
Location
San Jose, CA
Publisher
IEEE
Conference Name
IEEE/ACM International Conference on Computer-Aided Design (ICCAD)