Assessing the antimicrobial activity of zinc oxide thin films using disk diffusion and biofilm reactor

Journal Article

The electronic and chemical properties of semiconductor materials may be useful in preventing growth of microorganisms. In this article, in vitro methods for assessing microbial growth on semiconductor materials will be presented. The structural and biological properties of silicon wafers coated with zinc oxide thin films were evaluated using atomic force microscopy, X-ray photoelectron spectroscopy, and MTT viability assay. The antimicrobial properties of zinc oxide thin films were established using disk diffusion and CDC Biofilm Reactor studies. Our results suggest that zinc oxide and other semiconductor materials may play a leading role in providing antimicrobial functionality to the next-generation medical devices. © 2009 Elsevier B.V. All rights reserved.

Full Text

Duke Authors

Cited Authors

  • Gittard, SD; Perfect, JR; Monteiro-Riviere, NA; Wei, W; Jin, C; Narayan, RJ

Published Date

  • 2009

Published In

Volume / Issue

  • 255 / 11

Start / End Page

  • 5806 - 5811

International Standard Serial Number (ISSN)

  • 0169-4332

Digital Object Identifier (DOI)

  • 10.1016/j.apsusc.2009.01.009