Skip to main content
Journal cover image

Quantitative phase microscopy with off-axis optical coherence tomography.

Publication ,  Journal Article
Rinehart, MT; Jaedicke, V; Wax, A
Published in: Optics letters
April 2014

We have developed a modality for quantitative phase imaging within spectral domain optical coherence tomography based on using an off-axis reference beam. By tilting the propagation of the reference beam relative to that of the sample beam, a spatially varying fringe is generated. Upon detection of this fringe using a parallel spectral domain scheme, the fringe can be used to separate the interference component of the signal and obtain the complex sample field. In addition to providing quantitative phase measurements within a depth resolved measurement, this approach also allows elimination of the complex conjugate artifact, a known limitation of spectral interferometry. The principle of the approach is described here along with demonstration of its capabilities using technical samples.

Duke Scholars

Altmetric Attention Stats
Dimensions Citation Stats

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

April 2014

Volume

39

Issue

7

Start / End Page

1996 / 1999

Related Subject Headings

  • Tomography, Optical Coherence
  • Optics
  • Microscopy
  • Fourier Analysis
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 0906 Electrical and Electronic Engineering
  • 0206 Quantum Physics
  • 0205 Optical Physics
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Rinehart, M. T., Jaedicke, V., & Wax, A. (2014). Quantitative phase microscopy with off-axis optical coherence tomography. Optics Letters, 39(7), 1996–1999. https://doi.org/10.1364/ol.39.001996
Rinehart, Matthew T., Volker Jaedicke, and Adam Wax. “Quantitative phase microscopy with off-axis optical coherence tomography.Optics Letters 39, no. 7 (April 2014): 1996–99. https://doi.org/10.1364/ol.39.001996.
Rinehart MT, Jaedicke V, Wax A. Quantitative phase microscopy with off-axis optical coherence tomography. Optics letters. 2014 Apr;39(7):1996–9.
Rinehart, Matthew T., et al. “Quantitative phase microscopy with off-axis optical coherence tomography.Optics Letters, vol. 39, no. 7, Apr. 2014, pp. 1996–99. Epmc, doi:10.1364/ol.39.001996.
Rinehart MT, Jaedicke V, Wax A. Quantitative phase microscopy with off-axis optical coherence tomography. Optics letters. 2014 Apr;39(7):1996–1999.
Journal cover image

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

April 2014

Volume

39

Issue

7

Start / End Page

1996 / 1999

Related Subject Headings

  • Tomography, Optical Coherence
  • Optics
  • Microscopy
  • Fourier Analysis
  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
  • 0906 Electrical and Electronic Engineering
  • 0206 Quantum Physics
  • 0205 Optical Physics