Quantitative characterization of spectrograph entrance slit width on roll-off of fourier domain optical coherence tomography signals
Publication
, Journal Article
Braun, KE; Pyhtila, JW; Wax, A
Published in: Optics InfoBase Conference Papers
January 1, 2006
The effect of spectrograph slit width on the depth sensitivity of Fourier domain optical coherence tomography is investigated. A relationship between the two is derived mathematically and supported experimentally. © 2005 Optical Society of America.
Duke Scholars
Published In
Optics InfoBase Conference Papers
EISSN
2162-2701
Publication Date
January 1, 2006
Citation
APA
Chicago
ICMJE
MLA
NLM
Braun, K. E., Pyhtila, J. W., & Wax, A. (2006). Quantitative characterization of spectrograph entrance slit width on roll-off of fourier domain optical coherence tomography signals. Optics InfoBase Conference Papers.
Braun, K. E., J. W. Pyhtila, and A. Wax. “Quantitative characterization of spectrograph entrance slit width on roll-off of fourier domain optical coherence tomography signals.” Optics InfoBase Conference Papers, January 1, 2006.
Braun KE, Pyhtila JW, Wax A. Quantitative characterization of spectrograph entrance slit width on roll-off of fourier domain optical coherence tomography signals. Optics InfoBase Conference Papers. 2006 Jan 1;
Braun, K. E., et al. “Quantitative characterization of spectrograph entrance slit width on roll-off of fourier domain optical coherence tomography signals.” Optics InfoBase Conference Papers, Jan. 2006.
Braun KE, Pyhtila JW, Wax A. Quantitative characterization of spectrograph entrance slit width on roll-off of fourier domain optical coherence tomography signals. Optics InfoBase Conference Papers. 2006 Jan 1;
Published In
Optics InfoBase Conference Papers
EISSN
2162-2701
Publication Date
January 1, 2006