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Semi-parametric selection models for potentially non-ignorable attrition in panel studies with refreshment samples

Publication ,  Journal Article
Si, Y; Reiter, JP; Hillygus, DS
Published in: Political Analysis
January 1, 2015

Panel studies typically suffer from attrition. Ignoring the attrition can result in biased inferences if the missing data are systematically related to outcomes of interest. Unfortunately, panel data alone cannot inform the extent of bias due to attrition. Many panel studies also include refreshment samples, which are data collected from a random sample of new individuals during the later waves of the panel. Refreshment samples offer information that can be utilized to correct for biases induced by non-ignorable attrition while reducing reliance on strong assumptions about the attrition process. We present a Bayesian approach to handle attrition in two-wave panels with one refreshment sample and many categorical survey variables. The approach includes (1) an additive non-ignorable selection model for the attrition process; and (2) a Dirichlet process mixture of multinomial distributions for the categorical survey variables. We present Markov chain Monte Carlo algorithms for sampling from the posterior distribution of model parameters and missing data. We apply the model to correct attrition bias in an analysis of data from the 2007-08 Associated Press/Yahoo News election panel study.

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Published In

Political Analysis

DOI

EISSN

1476-4989

ISSN

1047-1987

Publication Date

January 1, 2015

Volume

23

Issue

1

Start / End Page

92 / 112

Related Subject Headings

  • Political Science & Public Administration
  • 4408 Political science
  • 1606 Political Science
 

Citation

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Si, Y., Reiter, J. P., & Hillygus, D. S. (2015). Semi-parametric selection models for potentially non-ignorable attrition in panel studies with refreshment samples. Political Analysis, 23(1), 92–112. https://doi.org/10.1093/pan/mpu009
Si, Y., J. P. Reiter, and D. S. Hillygus. “Semi-parametric selection models for potentially non-ignorable attrition in panel studies with refreshment samples.” Political Analysis 23, no. 1 (January 1, 2015): 92–112. https://doi.org/10.1093/pan/mpu009.
Si Y, Reiter JP, Hillygus DS. Semi-parametric selection models for potentially non-ignorable attrition in panel studies with refreshment samples. Political Analysis. 2015 Jan 1;23(1):92–112.
Si, Y., et al. “Semi-parametric selection models for potentially non-ignorable attrition in panel studies with refreshment samples.” Political Analysis, vol. 23, no. 1, Jan. 2015, pp. 92–112. Scopus, doi:10.1093/pan/mpu009.
Si Y, Reiter JP, Hillygus DS. Semi-parametric selection models for potentially non-ignorable attrition in panel studies with refreshment samples. Political Analysis. 2015 Jan 1;23(1):92–112.
Journal cover image

Published In

Political Analysis

DOI

EISSN

1476-4989

ISSN

1047-1987

Publication Date

January 1, 2015

Volume

23

Issue

1

Start / End Page

92 / 112

Related Subject Headings

  • Political Science & Public Administration
  • 4408 Political science
  • 1606 Political Science