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Galvanic corrosion induced degredation of tensile properties in micromachined polycrystalline silicon

Publication ,  Journal Article
Miller, DC; Boyce, BL; Gall, K; Stoldt, CR
Published in: Applied Physics Letters
May 17, 2007

Immersion of polycrystalline silicon in hydrofluoric acid-based solutions is often utilized in microsystem fabrication to liberate mechanical structures. The authors demonstrate, using microfabricated tensile specimens, that such etching can cause a catastrophic reduction in tensile strength and elastic modulus in silicon galvanically coupled to a metallic layer, such as commonly used gold. Galvanically corroded silicon exhibits grain-boundary attack leading to intergranular fracture and/or generalized material removal. The severity of damage and corresponding losses in strength and modulus depend on etch duration and etch chemistry. In contrast, without a metallic layer, uncorroded silicon fails transgranularly and independent of etch duration or chemistry. © 2007 American Institute of Physics.

Duke Scholars

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

May 17, 2007

Volume

90

Issue

19

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences
 

Citation

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Miller, D. C., Boyce, B. L., Gall, K., & Stoldt, C. R. (2007). Galvanic corrosion induced degredation of tensile properties in micromachined polycrystalline silicon. Applied Physics Letters, 90(19). https://doi.org/10.1063/1.2737370
Miller, D. C., B. L. Boyce, K. Gall, and C. R. Stoldt. “Galvanic corrosion induced degredation of tensile properties in micromachined polycrystalline silicon.” Applied Physics Letters 90, no. 19 (May 17, 2007). https://doi.org/10.1063/1.2737370.
Miller DC, Boyce BL, Gall K, Stoldt CR. Galvanic corrosion induced degredation of tensile properties in micromachined polycrystalline silicon. Applied Physics Letters. 2007 May 17;90(19).
Miller, D. C., et al. “Galvanic corrosion induced degredation of tensile properties in micromachined polycrystalline silicon.” Applied Physics Letters, vol. 90, no. 19, May 2007. Scopus, doi:10.1063/1.2737370.
Miller DC, Boyce BL, Gall K, Stoldt CR. Galvanic corrosion induced degredation of tensile properties in micromachined polycrystalline silicon. Applied Physics Letters. 2007 May 17;90(19).

Published In

Applied Physics Letters

DOI

ISSN

0003-6951

Publication Date

May 17, 2007

Volume

90

Issue

19

Related Subject Headings

  • Applied Physics
  • 51 Physical sciences
  • 40 Engineering
  • 10 Technology
  • 09 Engineering
  • 02 Physical Sciences