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MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature

Publication ,  Journal Article
Pant, B; Choi, S; Baumert, EK; Allen, BL; Graham, S; Gall, K; Pierron, ON
Published in: Experimental Mechanics
July 1, 2012

Microelectromechanical system (MEMS) devices based on electro-thermal actuation have been used over the past few years to perform tensile tests on nanomaterials. However, previous MEMS designs only allowed small (e. g., <100 nm) total displacement range without a significant increase in temperature near the nanospecimens (<20°C), thereby limiting the design of the load sensor or the range of nanomaterials to test. Here we characterize the thermo-mechanical behavior of three MEMS devices, using optical displacement measurements, micro-Raman temperature measurements, and finite element modeling. We observe the increase in temperature near the nanospecimen gap per displacement of thermal actuator to linearly decrease with the distance between nanospecimen gap and thermal actuator. We also present a MEMS device that can provide up to 1.6 μm of total displacement with less than 10°C increase in temperature near the nanospecimens, more than one order of magnitude improvement with respect to previously published MEMS material testing setups. This MEMS device can be used for accurate, temperature-controlled tensile testing of nanocrystalline metallic nanobeams. © 2011 Society for Experimental Mechanics.

Duke Scholars

Published In

Experimental Mechanics

DOI

EISSN

1741-2765

ISSN

0014-4851

Publication Date

July 1, 2012

Volume

52

Issue

6

Start / End Page

607 / 617

Related Subject Headings

  • Mechanical Engineering & Transports
  • 4017 Mechanical engineering
  • 4005 Civil engineering
  • 0915 Interdisciplinary Engineering
  • 0913 Mechanical Engineering
  • 0905 Civil Engineering
 

Citation

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MLA
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Pant, B., Choi, S., Baumert, E. K., Allen, B. L., Graham, S., Gall, K., & Pierron, O. N. (2012). MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature. Experimental Mechanics, 52(6), 607–617. https://doi.org/10.1007/s11340-011-9526-8
Pant, B., S. Choi, E. K. Baumert, B. L. Allen, S. Graham, K. Gall, and O. N. Pierron. “MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature.” Experimental Mechanics 52, no. 6 (July 1, 2012): 607–17. https://doi.org/10.1007/s11340-011-9526-8.
Pant B, Choi S, Baumert EK, Allen BL, Graham S, Gall K, et al. MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature. Experimental Mechanics. 2012 Jul 1;52(6):607–17.
Pant, B., et al. “MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature.” Experimental Mechanics, vol. 52, no. 6, July 2012, pp. 607–17. Scopus, doi:10.1007/s11340-011-9526-8.
Pant B, Choi S, Baumert EK, Allen BL, Graham S, Gall K, Pierron ON. MEMS-Based Nanomechanics: Influence of MEMS Design on Test Temperature. Experimental Mechanics. 2012 Jul 1;52(6):607–617.
Journal cover image

Published In

Experimental Mechanics

DOI

EISSN

1741-2765

ISSN

0014-4851

Publication Date

July 1, 2012

Volume

52

Issue

6

Start / End Page

607 / 617

Related Subject Headings

  • Mechanical Engineering & Transports
  • 4017 Mechanical engineering
  • 4005 Civil engineering
  • 0915 Interdisciplinary Engineering
  • 0913 Mechanical Engineering
  • 0905 Civil Engineering