Sensor attack detection in the presence of transient faults.
Publication
, Conference
Park, J; Ivanov, R; Weimer, J; Pajic, M; Lee, I
Published in: Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS)
2015
Duke Scholars
Published In
Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS)
DOI
ISBN
978-1-4503-3455-6
Publication Date
2015
Start / End Page
1 / 10
Publisher
ACM
Citation
APA
Chicago
ICMJE
MLA
NLM
Park, J., Ivanov, R., Weimer, J., Pajic, M., & Lee, I. (2015). Sensor attack detection in the presence of transient faults. In A. M. Bayen & M. S. Branicky (Eds.), Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS) (pp. 1–10). ACM. https://doi.org/10.1145/2735960.2735984
Park, J., R. Ivanov, J. Weimer, M. Pajic, and I. Lee. “Sensor attack detection in the presence of transient faults.” In Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS), edited by A. M. Bayen and M. S. Branicky, 1–10. ACM, 2015. https://doi.org/10.1145/2735960.2735984.
Park J, Ivanov R, Weimer J, Pajic M, Lee I. Sensor attack detection in the presence of transient faults. In: Bayen AM, Branicky MS, editors. Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS). ACM; 2015. p. 1–10.
Park, J., et al. “Sensor attack detection in the presence of transient faults.” Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS), edited by A. M. Bayen and M. S. Branicky, ACM, 2015, pp. 1–10. Manual, doi:10.1145/2735960.2735984.
Park J, Ivanov R, Weimer J, Pajic M, Lee I. Sensor attack detection in the presence of transient faults. In: Bayen AM, Branicky MS, editors. Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS). ACM; 2015. p. 1–10.
Published In
Proceedings of the 6th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS)
DOI
ISBN
978-1-4503-3455-6
Publication Date
2015
Start / End Page
1 / 10
Publisher
ACM