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Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles-Calibrated Contact-Resonance Atomic Force Microscopy.

Publication ,  Journal Article
Tu, Q; Lange, B; Parlak, Z; Lopes, JMJ; Blum, V; Zauscher, S
Published in: ACS nano
July 2016

Interfaces and subsurface layers are critical for the performance of devices made of 2D materials and heterostructures. Facile, nondestructive, and quantitative ways to characterize the structure of atomically thin, layered materials are thus essential to ensure control of the resultant properties. Here, we show that contact-resonance atomic force microscopy-which is exquisitely sensitive to stiffness changes that arise from even a single atomic layer of a van der Waals-adhered material-is a powerful experimental tool to address this challenge. A combined density functional theory and continuum modeling approach is introduced that yields sub-surface-sensitive, nanomechanical fingerprints associated with specific, well-defined structure models of individual surface domains. Where such models are known, this information can be correlated with experimentally obtained contact-resonance frequency maps to reveal the (sub)surface structure of different domains on the sample.

Duke Scholars

Published In

ACS nano

DOI

EISSN

1936-086X

ISSN

1936-0851

Publication Date

July 2016

Volume

10

Issue

7

Start / End Page

6491 / 6500

Related Subject Headings

  • Nanoscience & Nanotechnology
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Tu, Q., Lange, B., Parlak, Z., Lopes, J. M. J., Blum, V., & Zauscher, S. (2016). Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles-Calibrated Contact-Resonance Atomic Force Microscopy. ACS Nano, 10(7), 6491–6500. https://doi.org/10.1021/acsnano.6b02402
Tu, Qing, Björn Lange, Zehra Parlak, Joao Marcelo J. Lopes, Volker Blum, and Stefan Zauscher. “Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles-Calibrated Contact-Resonance Atomic Force Microscopy.ACS Nano 10, no. 7 (July 2016): 6491–6500. https://doi.org/10.1021/acsnano.6b02402.
Tu, Qing, et al. “Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles-Calibrated Contact-Resonance Atomic Force Microscopy.ACS Nano, vol. 10, no. 7, July 2016, pp. 6491–500. Epmc, doi:10.1021/acsnano.6b02402.
Journal cover image

Published In

ACS nano

DOI

EISSN

1936-086X

ISSN

1936-0851

Publication Date

July 2016

Volume

10

Issue

7

Start / End Page

6491 / 6500

Related Subject Headings

  • Nanoscience & Nanotechnology