Can carbon nanotube transistors be scaled without performance degradation?
Publication
, Conference
Franklin, AD; Tulevski, G; Hannon, JB; Chen, Z
Published in: Technical Digest International Electron Devices Meeting Iedm
December 1, 2009
The effects of channel length scaling on carbon nanotube field-effect transistor (CNTFET) performance was investigated by varying device lengths on the same nanotube. Results show that scaling improves performance with substantial increases in on-current, resistances closer to the quantum limit than have ever been reported, and the shortest (∼30 nm) well-behaving CNTFETs to date. © 2009 IEEE.
Duke Scholars
Published In
Technical Digest International Electron Devices Meeting Iedm
DOI
ISSN
0163-1918
Publication Date
December 1, 2009
Start / End Page
23.1.4
Citation
APA
Chicago
ICMJE
MLA
NLM
Franklin, A. D., Tulevski, G., Hannon, J. B., & Chen, Z. (2009). Can carbon nanotube transistors be scaled without performance degradation? In Technical Digest International Electron Devices Meeting Iedm (p. 23.1.4). https://doi.org/10.1109/IEDM.2009.5424296
Franklin, A. D., G. Tulevski, J. B. Hannon, and Z. Chen. “Can carbon nanotube transistors be scaled without performance degradation?” In Technical Digest International Electron Devices Meeting Iedm, 23.1.4, 2009. https://doi.org/10.1109/IEDM.2009.5424296.
Franklin AD, Tulevski G, Hannon JB, Chen Z. Can carbon nanotube transistors be scaled without performance degradation? In: Technical Digest International Electron Devices Meeting Iedm. 2009. p. 23.1.4.
Franklin, A. D., et al. “Can carbon nanotube transistors be scaled without performance degradation?” Technical Digest International Electron Devices Meeting Iedm, 2009, p. 23.1.4. Scopus, doi:10.1109/IEDM.2009.5424296.
Franklin AD, Tulevski G, Hannon JB, Chen Z. Can carbon nanotube transistors be scaled without performance degradation? Technical Digest International Electron Devices Meeting Iedm. 2009. p. 23.1.4.
Published In
Technical Digest International Electron Devices Meeting Iedm
DOI
ISSN
0163-1918
Publication Date
December 1, 2009
Start / End Page
23.1.4