Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories
Publication
, Journal Article
Chen, Y; Kuo, TW; De Salvo, B
Published in: IEEE Design and Test
June 1, 2017
Duke Scholars
Published In
IEEE Design and Test
DOI
ISSN
2168-2356
Publication Date
June 1, 2017
Volume
34
Issue
3
Start / End Page
6 / 7
Citation
APA
Chicago
ICMJE
MLA
NLM
Chen, Y., Kuo, T. W., & De Salvo, B. (2017). Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories. IEEE Design and Test, 34(3), 6–7. https://doi.org/10.1109/MDAT.2017.2682253
Chen, Y., T. W. Kuo, and B. De Salvo. “Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories.” IEEE Design and Test 34, no. 3 (June 1, 2017): 6–7. https://doi.org/10.1109/MDAT.2017.2682253.
Chen Y, Kuo TW, De Salvo B. Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories. IEEE Design and Test. 2017 Jun 1;34(3):6–7.
Chen, Y., et al. “Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories.” IEEE Design and Test, vol. 34, no. 3, June 2017, pp. 6–7. Scopus, doi:10.1109/MDAT.2017.2682253.
Chen Y, Kuo TW, De Salvo B. Guest Editors' Introduction: Critical and Enabling Techniques for Emerging Memories. IEEE Design and Test. 2017 Jun 1;34(3):6–7.
Published In
IEEE Design and Test
DOI
ISSN
2168-2356
Publication Date
June 1, 2017
Volume
34
Issue
3
Start / End Page
6 / 7