Design margin exploration of spin-torque transfer RAM (SPRAM)
Publication
, Conference
Chen, Y; Wang, X; Li, H; Liu, H; Dimitrov, DV
Published in: ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN
January 1, 2008
Duke Scholars
Published In
ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN
DOI
ISBN
978-0-7695-3117-5
Publication Date
January 1, 2008
Start / End Page
684 / 690
Location
San Jose, CA
Publisher
IEEE COMPUTER SOC
Conference Name
9th International Symposium on Quality Electronic Design
Citation
APA
Chicago
ICMJE
MLA
NLM
Chen, Y., Wang, X., Li, H., Liu, H., & Dimitrov, D. V. (2008). Design margin exploration of spin-torque transfer RAM (SPRAM). In ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (pp. 684–690). San Jose, CA: IEEE COMPUTER SOC. https://doi.org/10.1109/ISQED.2008.140
Chen, Yiran, Xiaobin Wang, Hai Li, Harry Liu, and Dimitar V. Dimitrov. “Design margin exploration of spin-torque transfer RAM (SPRAM).” In ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 684–90. IEEE COMPUTER SOC, 2008. https://doi.org/10.1109/ISQED.2008.140.
Chen Y, Wang X, Li H, Liu H, Dimitrov DV. Design margin exploration of spin-torque transfer RAM (SPRAM). In: ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN. IEEE COMPUTER SOC; 2008. p. 684–90.
Chen, Yiran, et al. “Design margin exploration of spin-torque transfer RAM (SPRAM).” ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, IEEE COMPUTER SOC, 2008, pp. 684–90. Wos, doi:10.1109/ISQED.2008.140.
Chen Y, Wang X, Li H, Liu H, Dimitrov DV. Design margin exploration of spin-torque transfer RAM (SPRAM). ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN. IEEE COMPUTER SOC; 2008. p. 684–690.
Published In
ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN
DOI
ISBN
978-0-7695-3117-5
Publication Date
January 1, 2008
Start / End Page
684 / 690
Location
San Jose, CA
Publisher
IEEE COMPUTER SOC
Conference Name
9th International Symposium on Quality Electronic Design