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Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar

Publication ,  Conference
Chen, L; Li, J; Chen, Y; Deng, Q; Shen, J; Liang, X; Jiang, L
Published in: Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
May 11, 2017

RRAM crossbar consisting of memristor devices can naturally carry out the matrix-vector multiplication; it thereby has gained a great momentum as a highly energy-efficient accelerator for neuromorphic computing. The resistance variations and stuck-at faults in the memristor devices, however, dramatically degrade not only the chip yield, but also the classification accuracy of the neural-networks running on the RRAM crossbar. Existing hardware-based solutions cause enormous overhead and power consumption, while software-based solutions are less efficient in tolerating stuck-at faults and large variations. In this paper, we propose an accelerator-friendly neural-network training method, by leveraging the inherent self-healing capability of the neural-network, to prevent the large-weight synapses from being mapped to the abnormal memristors based on the fault/variation distribution in the RRAM crossbar. Experimental results show the proposed method can pull the classification accuracy (10%-45% loss in previous works) up close to ideal level with ≤ 1% loss.

Duke Scholars

Published In

Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

DOI

ISBN

9783981537093

Publication Date

May 11, 2017

Start / End Page

19 / 24
 

Citation

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Chen, L., Li, J., Chen, Y., Deng, Q., Shen, J., Liang, X., & Jiang, L. (2017). Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar. In Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017 (pp. 19–24). https://doi.org/10.23919/DATE.2017.7926952
Chen, L., J. Li, Y. Chen, Q. Deng, J. Shen, X. Liang, and L. Jiang. “Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar.” In Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017, 19–24, 2017. https://doi.org/10.23919/DATE.2017.7926952.
Chen L, Li J, Chen Y, Deng Q, Shen J, Liang X, et al. Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar. In: Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. 2017. p. 19–24.
Chen, L., et al. “Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar.” Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017, 2017, pp. 19–24. Scopus, doi:10.23919/DATE.2017.7926952.
Chen L, Li J, Chen Y, Deng Q, Shen J, Liang X, Jiang L. Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar. Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. 2017. p. 19–24.

Published In

Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

DOI

ISBN

9783981537093

Publication Date

May 11, 2017

Start / End Page

19 / 24