Benchmark tests for MOSFET compact models with application to the PSP model
Publication
, Journal Article
Li, X; Wu, W; Jha, A; Gildenblat, G; van Langevelde, R; Smit, GDJ; Scholten, AJ; Klaassen, DBM; McAndrew, CC; Watts, J; Olsen, CM; Coram, GJ ...
Published in: IEEE Transactions on Electron Devices
January 23, 2009
This paper presents the results of several qualitative "benchmark" tests that were used to verify the physical behavior of the PSP model and its usefulness for future generations of CMOS IC design. These include newly developed tests and new experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs. © 2009 IEEE.
Duke Scholars
Published In
IEEE Transactions on Electron Devices
DOI
ISSN
0018-9383
Publication Date
January 23, 2009
Volume
56
Issue
2
Start / End Page
243 / 251
Related Subject Headings
- Applied Physics
- 0906 Electrical and Electronic Engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Li, X., Wu, W., Jha, A., Gildenblat, G., van Langevelde, R., Smit, G. D. J., … Victory, J. (2009). Benchmark tests for MOSFET compact models with application to the PSP model. IEEE Transactions on Electron Devices, 56(2), 243–251. https://doi.org/10.1109/TED.2008.2010570
Li, X., W. Wu, A. Jha, G. Gildenblat, R. van Langevelde, G. D. J. Smit, A. J. Scholten, et al. “Benchmark tests for MOSFET compact models with application to the PSP model.” IEEE Transactions on Electron Devices 56, no. 2 (January 23, 2009): 243–51. https://doi.org/10.1109/TED.2008.2010570.
Li X, Wu W, Jha A, Gildenblat G, van Langevelde R, Smit GDJ, et al. Benchmark tests for MOSFET compact models with application to the PSP model. IEEE Transactions on Electron Devices. 2009 Jan 23;56(2):243–51.
Li, X., et al. “Benchmark tests for MOSFET compact models with application to the PSP model.” IEEE Transactions on Electron Devices, vol. 56, no. 2, Jan. 2009, pp. 243–51. Scopus, doi:10.1109/TED.2008.2010570.
Li X, Wu W, Jha A, Gildenblat G, van Langevelde R, Smit GDJ, Scholten AJ, Klaassen DBM, McAndrew CC, Watts J, Olsen CM, Coram GJ, Chaudhry S, Victory J. Benchmark tests for MOSFET compact models with application to the PSP model. IEEE Transactions on Electron Devices. 2009 Jan 23;56(2):243–251.
Published In
IEEE Transactions on Electron Devices
DOI
ISSN
0018-9383
Publication Date
January 23, 2009
Volume
56
Issue
2
Start / End Page
243 / 251
Related Subject Headings
- Applied Physics
- 0906 Electrical and Electronic Engineering