Xin Li | Scholars@Duke

Xin Li
Professor in the Department of Electrical and Computer Engineering

Prof. Xin Li received the Ph.D. degree in Electrical and Computer Engineering from Carnegie Mellon University, Pittsburgh, Pennsylvania, in 2005, and the M.S. and B.S. degrees in Electronics Engineering from Fudan University, Shanghai, China, in 2001 and 1998, respectively.

In 2005, he co-founded Xigmix Inc. to commercialize his PhD research, and served as the Chief Technical Officer until the company was acquired by Extreme DA in 2007. In 2011, Extreme DA was further acquired by Synopsis (Nasdaq: SNPS). From 2009 to 2012, he was the Assistant Director for FCRP Focus Research Center for Circuit & System Solutions (C2S2), a national consortium of 13 research universities (CMU, MIT, Stanford, Berkeley, UIUC, UMich, Columbia, UCLA, among others) chartered by the U.S. semiconductor industry and U.S. Department of Defense to work on next-generation integrated circuit design challenges. From 2014 to 2015, he was the Assistant Director for the Center for Silicon System Implementation (CSSI), a CMU research center with 20 faculty members working on integrated circuits and systems. His research interests include integrated circuit, signal processing and data analytics.

He was an Associate Editor of IEEE Trans. on Biomedical Engineering (TBME), IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems (TCAD), ACM Trans. on Design Automation of Electronic Systems (TODAES), IEEE Design & Test (D&T), and Journal of Low Power Electronics (JOLPE). He was the Guest Editor for IEEE TCAD, IEEE TNANO, IEEE TBD, IEEE D&T, IEEE JETCAS, ACM TCPS, ACM JETC and VLSI Integration. He served on the Executive Committee of ACM Special Interest Group on Design Automation (SIGDA), IEEE Systems, Man, and Cybernetics Society Technical Committee on Cybernetics for Cyber-Physical Systems (TCCCPS), and IEEE Computer Society Technical Committee on VLSI (TCVLSI). He was the General Chair of ISVLSI, iNIS and FAC, and the Technical Program Chair of CAD/Graphics. He also served on the ACM/SIGDA Outstanding PhD Dissertation Award Selection Committee, the IEEE TTTC E. J. McCluskey Best Doctoral Thesis Selection Committee, the IEEE Outstanding Young Author Award Selection Committee, the Executive Committee of ISVLSI, GLSVLSI and iNIS, and the Technical Program Committee of DAC, ICCAD, ITC, ISVLSI, FAC, CAD/Graphics, ASICON and VLSI. He received the NSF Faculty Early Career Development Award (CAREER) in 2012, two IEEE Donald O. Pederson Best Paper Awards in 2013 and 2016, the Best Paper Award from Design Automation Conference (DAC) in 2010, two IEEE/ACM William J. McCalla ICCAD Best Paper Awards in 2004 and 2011, and the Best Paper Award from International Symposium on Integrated Circuits (ISIC) in 2014. In addition to these awards, he also received six Best Paper Nominations from Design Automation Conference (DAC), International Conference on Computer-Aided Design (ICCAD) and Custom Integrated Circuits Conference (CICC).

Current Appointments & Affiliations

Professor in the Department of Electrical and Computer Engineering, Electrical and Computer Engineering, Pratt School of Engineering 2017
Director of Institute of Applied Physical Sciences and Engineering at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2017
Director of Master of Engineering Program in Electrical and Computer Engineering at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2017
Director of Data Science Research Center at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2017
Associate Dean for Research at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2019
Professor of Electrical and Computer Engineering at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2017

Contact Information

130 Hudson Hall, Box 90291, Durham, NC 27708
2529 CIEMAS Building, Durham, NC 27708
xinli.ece@duke.edu
Li Research Group

Background
Education, Training, & Certifications
- Ph.D., Carnegie Mellon University 2005
- MR, Fudan University (China) 2001
Duke Appointment History
- Director of Data Science Research Center at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2017 - 2019
- Professor of Electrical and Computer Engineering at Duke Kunshan University, DKU Faculty, Duke Kunshan University 2017 - 2019
- Adjunct Professor in the Department of Electrical and Computer Engineering, Electrical and Computer Engineering, Pratt School of Engineering 2016
Recognition
In the News
- OCT 26, 2018 Pratt School of Engineering
  
  Duke Engineers Are Inventing Headlights That Recognize Surrounding Environments
- MAR 5, 2018 Pratt School of Engineering
  
  Accelerating Self-Driving Car Innovation
- OCT 7, 2016 Pratt School of Engineering
  
  Xin Li: Pushing Integrated Circuits to New Heights and New Frontiers
Awards & Honors
Expertise
Global Scholarship
- Expertise
  - China (Country)
Research
Selected Grants
- IUCRC Proposal Phase 1 Duke: Center for Alternative Sustainable and Intelligent Computing (ASIC) awarded by National Science Foundation 2018 - 2023
- SHF: Small: Fast Sign-Off of Machine Learning Systems: From Circuit-Level Modeling to Statistical System Validation awarded by National Science Foundation 2018 - 2022
- SHF: Small: Re-thinking Polynomial Programming: Efficient Design and Optimization of Resilient Analog/RF Integrated Systems by Convexification awarded by National Science Foundation 2017 - 2019
- Planning IUCRC Duke University: Center for Alternative Sustainable and Intelligent Computing awarded by National Science Foundation 2017 - 2018
External Relationships
- Cadence Design Systems
- Carnegie Mellon University
- Chongqing University of Technology
- ConvertLab
- Donghua University
- East China Normal University
- Elsevier
- Fudan University
- Ivo Artificial Intelligence Technology
- R&B Smart Devices
- Shandong Yingcai University
- Singapore Institute of Manufacturing Technology
- Springer Publishing Company
- Tsinghua University
- X&L Holding
Publications & Artistic Works
Selected Publications
- Academic Articles
  - Liu, M., F. Ye, X. Li, K. Chakrabarty, and X. Gu. “Board-Level Functional Fault Identification Using Streaming Data.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 40, no. 9 (September 1, 2021): 1920–33. https://doi.org/10.1109/TCAD.2020.3031865.
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  - Li, M., H. Xu, X. Huang, Z. Song, X. Liu, and X. Li. “Facial Expression Recognition with Identity and Emotion Joint Learning.” Ieee Transactions on Affective Computing 12, no. 2 (April 1, 2021): 544–50. https://doi.org/10.1109/TAFFC.2018.2880201.
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  - Pan, R., Z. Zhang, X. Li, K. Chakrabarty, and X. Gu. “Black-Box Test-Cost Reduction Based on Bayesian Network Models.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 40, no. 2 (February 1, 2021): 386–99. https://doi.org/10.1109/TCAD.2020.2994257.
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  - Gao, Z., J. Tao, Y. Su, D. Zhou, X. Zeng, and X. Li. “Fast Statistical Analysis of Rare Failure Events with Truncated Normal Distribution in High-Dimensional Variation Space.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems, January 1, 2021. https://doi.org/10.1109/TCAD.2021.3068107.
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  - Liu, M., X. Li, K. Chakrabarty, and X. Gu. “Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled by Domain Adaptation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems, January 1, 2021. https://doi.org/10.1109/TCAD.2021.3065919.
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  - Tao, J., H. Yu, Y. Su, D. Zhou, X. Zeng, and X. Li. “Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems, January 1, 2021. https://doi.org/10.1109/TCAD.2021.3073075.
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  - Hu, S., X. Li, H. He, S. Cui, and M. Parashar. “Big Data for Cyber-Physical Systems.” Ieee Transactions on Big Data 6, no. 4 (December 1, 2020): 606–8. https://doi.org/10.1109/TBDATA.2020.3033101.
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  - Peng, F., H. Yu, J. Tao, Y. Su, D. Zhou, X. Zeng, and X. Li. “Efficient Statistical Analysis for Correlated Rare Failure Events via Asymptotic Probability Approximation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 39, no. 12 (December 1, 2020): 4971–84. https://doi.org/10.1109/TCAD.2020.2979804.
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  - Gao, Z., J. Tao, Y. Su, D. Zhou, X. Zeng, and X. Li. “Efficient Rare Failure Analysis over Multiple Corners via Correlated Bayesian Inference.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 39, no. 10 (October 1, 2020): 2029–41. https://doi.org/10.1109/TCAD.2019.2949524.
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  - Nguyen, C. M., X. Li, and R. D. S. Blanton. “Partial Bayesian Co-training for Virtual Metrology.” Ieee Transactions on Industrial Informatics 16, no. 5 (May 1, 2020): 2937–45. https://doi.org/10.1109/TII.2019.2903718.
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  - Pan, R., J. Tao, Y. Su, D. Zhou, X. Zeng, and X. Li. “Analog/RF post-silicon tuning via Bayesian optimization.” Acm Transactions on Design Automation of Electronic Systems 25, no. 1 (December 1, 2019). https://doi.org/10.1145/3365577.
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  - Seo, J. S., Y. Cao, X. Li, and P. Whatmough. “Guest editors’ introduction: Hardware and algorithms for energy-constrained on-chip machine learning (part 2).” Acm Journal on Emerging Technologies in Computing Systems 15, no. 4 (December 1, 2019). https://doi.org/10.1145/3359336.
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  - Feng, X., Y. Jiang, X. Yang, M. Du, and X. Li. “Computer vision algorithms and hardware implementations: A survey.” Integration 69 (November 1, 2019): 309–20. https://doi.org/10.1016/j.vlsi.2019.07.005.
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  - Tao, J., Y. Su, D. Zhou, X. Zeng, and X. Li. “Graph-Constrained Sparse Performance Modeling for Analog Circuit Optimization via SDP Relaxation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 38, no. 8 (August 1, 2019): 1385–98. https://doi.org/10.1109/TCAD.2018.2848590.
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  - Seo, J. S., Y. Cao, X. Li, and P. Whatmough. “Guest editors' introduction to the special section on hardware and algorithms for energy-constrained on-chip machine learning.” Acm Journal on Emerging Technologies in Computing Systems 15, no. 2 (June 1, 2019). https://doi.org/10.1145/3322433.
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  - Saragadam, Vishwanath, Xin Li, and Aswin C. Sankaranarayanan. “Cross-Scale Predictive Dictionaries.” Ieee Transactions on Image Processing : A Publication of the Ieee Signal Processing Society 28, no. 2 (February 2019): 803–14. https://doi.org/10.1109/tip.2018.2869719.
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  - Alawieh, M. B., F. Wang, and X. Li. “Efficient hierarchical performance modeling for analog and mixed-signal circuits via Bayesian co-learning.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 37, no. 12 (December 1, 2018): 2986–98. https://doi.org/10.1109/TCAD.2018.2789778.
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  - Jun, M., R. Negi, S. Yin, M. Alawieh, F. Wang, M. Sunny, T. Mukherjee, and X. Li. “Environment-Adaptable Fast Multi-Resolution (EAF-MR) optimization in large-scale RF-FPGA systems.” Eurasip Journal on Wireless Communications and Networking 2018, no. 1 (December 1, 2018). https://doi.org/10.1186/s13638-018-1042-4.
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  - Zhu, Q., A. Sangiovanni-Vincentelli, S. Hu, and X. Li. “Design Automation for Cyber-Physical Systems [Scanning the Issue].” Proceedings of the Ieee 106, no. 9 (September 1, 2018): 1479–83. https://doi.org/10.1109/JPROC.2018.2865229.
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  - Liu, Y., X. Chen, D. Kadambi, A. Bari, X. Li, S. Hu, and P. Zhou. “Dependable visual light-based indoor localization with automatic anomaly detection for location-based service of mobile cyber-physical systems.” Acm Transactions on Cyber Physical Systems 3, no. 1 (August 1, 2018). https://doi.org/10.1145/3162051.
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  - Cao, Y., X. Li, J. S. Seo, and G. Dasika. “Guest editors' introduction: Frontiers of hardware and algorithms for on-chip learning.” Acm Journal on Emerging Technologies in Computing Systems 14, no. 2 (July 1, 2018). https://doi.org/10.1145/3205944.
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  - Xue, Y., X. Li, and R. D. Blanton. “Improving Diagnostic Resolution of Failing ICs Through Learning.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 37, no. 6 (June 1, 2018): 1288–97. https://doi.org/10.1109/TCAD.2016.2611499.
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  - Alawieh, M. B., F. Wang, and X. Li. “Identifying wafer-level systematic failure patterns via unsupervised learning.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 37, no. 4 (April 1, 2018): 832–44. https://doi.org/10.1109/TCAD.2017.2729469.
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  - Shi, W., M. B. Alawieh, X. Li, and H. Yu. “Algorithm and hardware implementation for visual perception system in autonomous vehicle: A survey.” Integration, the Vlsi Journal 59 (September 1, 2017): 148–56. https://doi.org/10.1016/j.vlsi.2017.07.007.
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  - Li, X., J. Liu, S. Chen, S. Zhang, B. Deng, T. Xiao, Y. Sun, and Y. Chen. “Process optimization of inductively coupled plasma etching for large aspect ratio silicon nanopillars.” Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams 29, no. 7 (July 1, 2017). https://doi.org/10.11884/HPLPB201729.170028.
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  - Albalawi, H., Y. Li, and X. Li. “Training fixed-point classifiers for on-chip low-power implementation.” Acm Transactions on Design Automation of Electronic Systems 22, no. 4 (June 1, 2017). https://doi.org/10.1145/3057275.
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  - Zeng, W., H. Zhu, X. Zeng, D. Zhou, R. Liu, and X. Li. “C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 36, no. 6 (June 1, 2017): 899–912. https://doi.org/10.1109/TCAD.2016.2613927.
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  - Mohanty, S. P., X. Li, H. Li, and Y. Cao. “Guest Editorial Special Issue on Nanoelectronic Devices and Circuits for Next Generation Sensing and Information Processing.” Ieee Transactions on Nanotechnology 16, no. 3 (May 1, 2017): 383–86. https://doi.org/10.1109/TNANO.2017.2680420.
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  - Shi, W., X. Li, Z. Yu, and G. Overett. “An FPGA-Based Hardware Accelerator for Traffic Sign Detection.” Ieee Transactions on Very Large Scale Integration (Vlsi) Systems 25, no. 4 (April 1, 2017): 1362–72. https://doi.org/10.1109/TVLSI.2016.2631428.
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  - Wang, Yuhao, Xin Li, Kai Xu, Fengbo Ren, and Hao Yu. “Data-Driven Sampling Matrix Boolean Optimization for Energy-Efficient Biomedical Signal Acquisition by Compressive Sensing.” Ieee Transactions on Biomedical Circuits and Systems 11, no. 2 (April 2017): 255–66. https://doi.org/10.1109/tbcas.2016.2597310.
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  - Blanton, R. D. S., F. Wang, C. Xue, P. K. Nag, Y. Xue, and X. Li. “DFM evaluation using IC diagnosis data.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 36, no. 3 (March 1, 2017): 463–74. https://doi.org/10.1109/TCAD.2016.2587283.
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  - Liu, X., S. Sun, X. Li, H. Qian, and P. Zhou. “Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 36, no. 3 (March 1, 2017): 421–34. https://doi.org/10.1109/TCAD.2016.2611502.
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  - Wang, M., C. Yan, X. Li, D. Zhou, and X. Zeng. “High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis.” Ieee Transactions on Very Large Scale Integration (Vlsi) Systems 25, no. 3 (March 1, 2017): 806–19. https://doi.org/10.1109/TVLSI.2016.2601606.
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  - Cao, Y., X. Li, T. Kim, and S. Gupta. “Guest editors' introduction: Hardware and algorithms for on-chip learning.” Acm Journal on Emerging Technologies in Computing Systems 13, no. 3 (February 1, 2017). https://doi.org/10.1145/3022193.
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  - Baker, K., G. Hug, and X. Li. “Energy Storage Sizing Taking Into Account Forecast Uncertainties and Receding Horizon Operation.” Ieee Transactions on Sustainable Energy 8, no. 1 (January 1, 2017): 331–40. https://doi.org/10.1109/TSTE.2016.2599074.
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  - Zhang, K., Q. Wu, and X. Li. “Relay participated-new-type building energy management system: An energy-efficient routing scheme for wireless sensor network-based building energy management systems.” International Journal of Distributed Sensor Networks 13, no. 1 (January 1, 2017). https://doi.org/10.1177/1550147716683613.
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  - Liao, C., J. Tao, H. Yu, Z. Tang, Y. Su, D. Zhou, X. Zeng, and X. Li. “Efficient Hybrid Performance Modeling for Analog Circuits Using Hierarchical Shrinkage Priors.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 35, no. 12 (December 1, 2016): 2148–52. https://doi.org/10.1109/TCAD.2016.2543021.
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  - Li, X., C. Kashyap, and C. J. Myers. “Guest Editors' Introduction Challenges and Opportunities in Analog/Mixed-Signal CAD.” Ieee Design and Test 33, no. 5 (October 1, 2016): 5–6. https://doi.org/10.1109/MDAT.2016.2594182.
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  - Chen, X., L. Wang, B. Li, Y. Wang, X. Li, Y. Liu, and H. Yang. “Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 35, no. 9 (September 1, 2016): 1435–48. https://doi.org/10.1109/TCAD.2015.2511074.
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  - Ghosh, S., A. Iyengar, S. Motaman, R. Govindaraj, J. W. Jang, J. Chung, J. Park, X. Li, R. Joshi, and D. Somasekhar. “Overview of Circuits, Systems, and Applications of Spintronics.” Ieee Journal on Emerging and Selected Topics in Circuits and Systems 6, no. 3 (September 1, 2016): 265–68. https://doi.org/10.1109/JETCAS.2016.2601310.
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  - Ghosh, S., R. V. Joshi, D. Somasekhar, and X. Li. “Guest Editorial Emerging Memories - Technology, Architecture and Applications (Second Issue).” Ieee Journal on Emerging and Selected Topics in Circuits and Systems 6, no. 3 (September 1, 2016): 261–64. https://doi.org/10.1109/JETCAS.2016.2598690.
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  - Wang, F., P. Cachecho, W. Zhang, S. Sun, X. Li, R. Kanj, and C. Gu. “Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 35, no. 8 (August 1, 2016): 1255–68. https://doi.org/10.1109/TCAD.2015.2504329.
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  - Zhang, K., Z. Feng, and X. Li. “Weight-based link scheduling for convergecast in WirelessHART network.” International Journal of Distributed Sensor Networks 12, no. 7 (July 22, 2016). https://doi.org/10.1177/155014774594183.
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  - Ghosh, S., R. V. Joshi, D. Somasekhar, and X. Li. “Guest Editorial Emerging Memories - Technology, Architecture and Applications (First Issue).” Ieee Journal on Emerging and Selected Topics in Circuits and Systems 6, no. 2 (June 1, 2016): 105–8. https://doi.org/10.1109/JETCAS.2016.2571858.
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  - Liao, C., J. Tao, X. Zeng, Y. Su, D. Zhou, and X. Li. “Efficient Spatial Variation Modeling of Nanoscale Integrated Circuits Via Hidden Markov Tree.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 35, no. 6 (June 1, 2016): 971–84. https://doi.org/10.1109/TCAD.2015.2481868.
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  - Zhao, Y., T. Kim, H. Shin, S. X. D. Tan, X. Li, H. Chen, and H. Wang. “Statistical rare-event analysis and parameter guidance by elite learning sample selection.” Acm Transactions on Design Automation of Electronic Systems 21, no. 4 (May 27, 2016). https://doi.org/10.1145/2875422.
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  - Mahzoon, M., C. Li, X. Li, and P. Grover. “Energy-constrained distributed learning and classification by exploiting relative relevance of sensors' data.” Ieee Journal on Selected Areas in Communications 34, no. 5 (May 1, 2016): 1417–30. https://doi.org/10.1109/JSAC.2016.2545381.
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  - Baker, K., J. Guo, G. Hug, and X. Li. “Distributed MPC for Efficient Coordination of Storage and Renewable Energy Sources Across Control Areas.” Ieee Transactions on Smart Grid 7, no. 2 (March 1, 2016): 992–1001. https://doi.org/10.1109/TSG.2015.2512503.
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  - Tao, J., C. Liao, X. Zeng, and X. Li. “Harvesting Design Knowledge From the Internet: High-Dimensional Performance Tradeoff Modeling for Large-Scale Analog Circuits.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 35, no. 1 (January 1, 2016): 23–36. https://doi.org/10.1109/TCAD.2015.2449240.
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  - Zhang, Jinyin, Xin Li, Stephen T. Foldes, Wei Wang, Jennifer L. Collinger, Douglas J. Weber, and Anto Bagić. “Decoding Brain States Based on Magnetoencephalography From Prespecified Cortical Regions.” Ieee Transactions on Bio Medical Engineering 63, no. 1 (January 2016): 30–42. https://doi.org/10.1109/tbme.2015.2439216.
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  - Sun, S., X. Li, H. Liu, K. Luo, and B. Gu. “Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 34, no. 7 (July 1, 2015): 1096–1109. https://doi.org/10.1109/TCAD.2015.2404895.
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  - Zhu, H., Y. Wang, F. Liu, X. Li, X. Zeng, and P. Feldmann. “Efficient transient analysis of power delivery network with clock/power gating by sparse approximation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 34, no. 3 (March 1, 2015): 409–21. https://doi.org/10.1109/TCAD.2015.2391256.
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  - Wu, P. H., M. P. H. Lin, T. C. Chen, C. F. Yeh, X. Li, and T. Y. Ho. “A novel analog physical synthesis methodology integrating existent design expertise.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 34, no. 2 (February 1, 2015): 199–212. https://doi.org/10.1109/TCAD.2014.2379630.
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  - Gu, C., M. Zaheer, and X. Li. “Multiple-population moment estimation: Exploiting interpopulation correlation for efficient moment estimation in analog/mixed-signal validation.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 33, no. 7 (January 1, 2014): 961–74. https://doi.org/10.1109/TCAD.2014.2304929.
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  - Plouchart, J. O., B. Parker, B. Sadhu, A. Valdes-Garcia, D. Friedman, M. Sanduleanu, F. Wang, X. Li, and A. Balteanu. “Adaptive circuit design methodology and test applied to millimeter-wave circuits.” Ieee Design and Test 31, no. 6 (January 1, 2014): 8–18. https://doi.org/10.1109/MDAT.2014.2343192.
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  - Sun, S., F. Wang, S. Yaldiz, X. Li, L. Pileggi, A. Natarajan, M. Ferriss, et al. “Indirect performance sensing for on-chip self-healing of analog and RF circuits.” Ieee Transactions on Circuits and Systems I: Regular Papers 61, no. 8 (January 1, 2014): 2243–52. https://doi.org/10.1109/TCSI.2014.2333311.
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  - Althoff, M., A. Rajhans, B. H. Krogh, S. Yaldiz, X. Li, and L. Pileggi. “Formal verification of phase-locked loops using reachability analysis and continuization.” Communications of the Acm 56, no. 10 (October 22, 2013): 97–104. https://doi.org/10.1145/2507771.2507783.
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  - Zhang, W., K. Balakrishnan, X. Li, D. S. Boning, S. Saxena, A. Strojwas, and R. A. Rutenbar. “Efficient spatial pattern analysis for variation decomposition via robust sparse regression.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 32, no. 7 (July 15, 2013): 1072–85. https://doi.org/10.1109/TCAD.2013.2245942.
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  - Sadhu, B., M. A. Ferriss, A. S. Natarajan, S. Yaldiz, J. O. Plouchart, A. V. Rylyakov, A. Valdes-Garcia, et al. “Erratum: A linearized, low phase noise VCO based 25 GHz PLL with autonomic biasing (IEEE Journal of Solid-State Circuits (2013) 48:5 (1138-1150)).” Ieee Journal of Solid State Circuits 48, no. 6 (June 5, 2013): 1539. https://doi.org/10.1109/JSSC.2013.2263875.
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  - Sadhu, B., M. A. Ferriss, A. S. Natarajan, S. Yaldiz, J. O. Plouchart, A. V. Rylyakov, A. Valdes-Garcia, et al. “A linearized, low-phase-noise VCO-based 25-GHz PLL with autonomic biasing.” Ieee Journal of Solid State Circuits 48, no. 5 (May 1, 2013): 1138–50. https://doi.org/10.1109/JSSC.2013.2252513.
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  - Huang, Y., W. Li, S. Hu, R. Xie, X. Li, J. Fu, Y. Sun, et al. “A high-linearity WCDMA/GSM reconfigurable transceiver in 0.13-μm CMOS.” Ieee Transactions on Microwave Theory and Techniques 61, no. 1 (January 1, 2013): 204–17. https://doi.org/10.1109/TMTT.2012.2222913.
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  - Kim, Y., J. Kim, J. J. Kong, B. V. K. Vijaya Kumar, and X. Li. “Verify level control criteria for multi-level cell flash memories and their applications Coding and Signal Processing for Non-Volatile Memories.” Eurasip Journal on Advances in Signal Processing 2012, no. 1 (December 1, 2012). https://doi.org/10.1186/1687-6180-2012-196.
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  - Sun, S., Y. Feng, C. Dong, and X. Li. “Efficient SRAM failure rate prediction via Gibbs sampling.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 31, no. 12 (November 26, 2012): 1831–44. https://doi.org/10.1109/TCAD.2012.2209884.
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  - Zhang, W., X. Li, F. Liu, E. Acar, R. A. Rutenbar, and R. D. Blanton. “Virtual probe: A statistical framework for low-cost silicon characterization of nanoscale integrated circuits.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 30, no. 12 (December 1, 2011): 1814–27. https://doi.org/10.1109/TCAD.2011.2164536.
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  - Li, X., J. Fu, Y. Huang, and Z. Hong. “CMOS highly linear direct-conversion transmitter for WCDMA with fine gain accuracy.” Journal of Semiconductors 32, no. 8 (August 1, 2011). https://doi.org/10.1088/1674-4926/32/8/085010.
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  - Zhang, Jinyin, Gustavo Sudre, Xin Li, Wei Wang, Douglas J. Weber, and Anto Bagic. “Clustering linear discriminant analysis for MEG-based brain computer interfaces.” Ieee Transactions on Neural Systems and Rehabilitation Engineering : A Publication of the Ieee Engineering in Medicine and Biology Society 19, no. 3 (June 2011): 221–31. https://doi.org/10.1109/tnsre.2011.2116125.
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  - Zhang, Jinyin, Gustavo Sudre, Xin Li, Wei Wang, Douglas J. Weber, and Anto Bagic. “Task-related MEG source localization via discriminant analysis.” Annual International Conference of the Ieee Engineering in Medicine and Biology Society. Ieee Engineering in Medicine and Biology Society. Annual International Conference 2011 (January 2011): 2351–54. https://doi.org/10.1109/iembs.2011.6090657.
    Full Text
  - Li, X. “Finding deterministic solution from underdetermined equation: Large-scale performance variability modeling of analog/RF circuits.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 29, no. 11 (November 1, 2010): 1661–68. https://doi.org/10.1109/TCAD.2010.2061292.
    Full Text
  - Guo, Chenlei, Xin Li, Samu Taulu, Wei Wang, and Douglas J. Weber. “Real-time robust signal space separation for magnetoencephalography.” Ieee Transactions on Bio Medical Engineering 57, no. 8 (August 2010): 1856–66. https://doi.org/10.1109/tbme.2010.2043358.
    Full Text
  - Stevanović, I., X. Li, C. C. McAndrew, K. R. Green, and G. Gildenblat. “Statistical modeling of inter-device correlations with BPV.” Solid State Electronics 54, no. 8 (August 1, 2010): 796–800. https://doi.org/10.1016/j.sse.2010.03.018.
    Full Text
  - Li, X., C. C. McAndrew, W. Wu, S. Chaudhry, J. Victory, and G. Gildenblat. “Statistical modeling with the PSP MOSFET model.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 29, no. 4 (April 1, 2010): 599–609. https://doi.org/10.1109/TCAD.2010.2042892.
    Full Text
  - McAndrew, C. C., X. Li, I. Stevanović, and G. Gildenblat. “Extensions to backward propagation of variance for statistical modeling.” Ieee Design and Test of Computers 27, no. 2 (March 1, 2010): 36–43. https://doi.org/10.1109/MDT.2010.44.
    Full Text
  - Xu, Y., K. L. Hsiung, X. Li, L. T. Pileggi, and S. P. Boyd. “Regular analog/RF integrated circuits design using optimization with recourse including ellipsoidal uncertainty.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 28, no. 5 (May 1, 2009): 623–37. https://doi.org/10.1109/TCAD.2009.2013996.
    Full Text
  - Li, X., W. Wu, A. Jha, G. Gildenblat, R. van Langevelde, G. D. J. Smit, A. J. Scholten, et al. “Benchmark tests for MOSFET compact models with application to the PSP model.” Ieee Transactions on Electron Devices 56, no. 2 (January 23, 2009): 243–51. https://doi.org/10.1109/TED.2008.2010570.
    Full Text
  - Wu, W., X. Li, G. Gildenblat, G. O. Workman, S. Veeraraghavan, C. C. McAndrew, R. van Langevelde, et al. “PSP-SOI: An advanced surface potential based compact model of partially depleted SOI MOSFETs for circuit simulations.” Solid State Electronics 53, no. 1 (January 1, 2009): 18–29. https://doi.org/10.1016/j.sse.2008.09.009.
    Full Text
  - Xu, Y., K. L. Hsiung, X. Li, L. T. Pileggi, and S. P. Boyd. “Regular analog/RF integrated circuits design using optimization with recourse including ellipsoidal uncertainty.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 28, no. 1 (January 1, 2009): 623–37.
  - Li, X., Y. Zhan, and L. T. Pileggi. “Quadratic statistical MAX approximation for parametric yield estimation of analog/RF integrated circuits.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 27, no. 5 (May 1, 2008): 831–42. https://doi.org/10.1109/TCAD.2008.917582.
    Full Text
  - Calhoun, B. H., Y. Cao, X. Li, K. Mai, L. T. Pileggi, R. A. Rutenbar, and K. L. Shepard. “Digital circuit design challenges and opportunities in the era of nanoscale CMOS.” Proceedings of the Ieee 96, no. 2 (January 1, 2008): 343–65. https://doi.org/10.1109/JPROC.2007.911072.
    Full Text
  - Wu, W., X. Li, G. Gildenblat, G. O. Workman, S. Veeraraghavan, C. C. McAndrew, R. van Langevelde, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassen. “A compact model for valence-band electron tunneling current in partially depleted SOI MOSFETs.” Ieee Transactions on Electron Devices 54, no. 2 (February 1, 2007): 316–22. https://doi.org/10.1109/TED.2006.888750.
    Full Text
  - Li, X., J. Le, P. Gopalakrishnan, and L. T. Pileggi. “Asymptotic probability extraction for nonnormal performance distributions.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 26, no. 1 (January 1, 2007): 16–37. https://doi.org/10.1109/TCAD.2006.882593.
    Full Text
  - Li, X., P. Gopalakrishnan, Y. Xu, and L. T. Pileggi. “Robust analog/RF circuit design with projection-based performance modeling.” Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems 26, no. 1 (January 1, 2007): 2–15. https://doi.org/10.1109/TCAD.2006.882513.
    Full Text
  - Li, X., J. Le, and L. T. Pileggi. “Statistical performance modeling and optimization.” Foundations and Trends in Electronic Design Automation 1, no. 4 (December 1, 2006): 331–480. https://doi.org/10.1561/1000000008.
    Full Text
  - Gildenblat, G., X. Li, W. Wu, H. Wang, A. Jha, R. Van Langevelde, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassen. “PSP: An advanced surface-potential-based MOSFET model for circuit simulation.” Ieee Transactions on Electron Devices 53, no. 9 (September 1, 2006): 1979–93. https://doi.org/10.1109/TED.2005.881006.
    Full Text
  - Wang, H., X. Li, W. Wu, G. Gildenblat, R. Van Langevelde, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassen. “A unified nonquasi-static MOSFET model for large-signal and small-signal simulations.” Ieee Transactions on Electron Devices 53, no. 9 (September 1, 2006): 2035–42. https://doi.org/10.1109/TED.2005.881003.
    Full Text
  - Li, X., X. Zeng, D. Zhou, X. Ling, and W. Cai. “Behavioral modeling for analog system-level simulation by wavelet collocation method.” Ieee Transactions on Circuits and Systems Ii: Analog and Digital Signal Processing 50, no. 6 (June 1, 2003): 299–314. https://doi.org/10.1109/TCSII.2003.812917.
    Full Text
  - Li, X., X. Zeng, J. Shi, W. Chen, D. Zhou, and X. Ling. “High-speed clock tree simulation with fast wavelet collocation method.” Chinese Journal of Electronics 12, no. 2 (April 1, 2003): 259–65.
  - Li, X., B. Hu, X. T. Ling, Z. Liu, and C. Chang. “FECG detection based on blind signal separation.” Chinese Journal of Biomedical Engineering 21, no. 5 (October 20, 2002): 461–65.
  - Li, X., B. Hu, X. Ling, and X. Zeng. “A wavelet-balance approach for steady-state analysis of nonlinear circuits.” Ieee Transactions on Circuits and Systems I: Fundamental Theory and Applications 49, no. 5 (May 1, 2002): 689–94. https://doi.org/10.1109/TCSI.2002.1001960.
    Full Text
  - Li, X., B. Hu, and X. T. Ling. “Wavelet balance approach for steady-state analysis in nonlinear circuits.” Tien Tzu Hsueh Pao/Acta Electronica Sinica 29, no. 6 (June 1, 2001): 792–95.
  - Li, X., B. Hu, X. T. Ling, and X. Zeng. “Fast wavelet collocation method with nonlinear companding in time domain.” Tien Tzu Hsueh Pao/Acta Electronica Sinica 29, no. 5 (May 1, 2001): 611–14.
- Book Sections
  - Li, X., R. D. Shawn Blanton, P. Grover, and D. E. Thomas. “Ultra-low-power biomedical circuit design and optimization: Catching the don't cares.” In Emerging Technology and Architecture for Big-Data Analytics, 159–73, 2017. https://doi.org/10.1007/978-3-319-54840-1_7.
    Full Text
  - Sun, S., F. Wang, S. Yaldiz, X. Li, L. Pileggi, A. Natarajan, M. Ferriss, et al. “Self-healing analog/RF circuits.” In Nano-CMOS and Post-CMOS Electronics: Circuits and Design, 1–34, 2016. https://doi.org/10.1049/PBCS030E_ch1.
    Full Text
  - Gildenblat, G., W. Wu, X. Li, R. Van Langevelde, A. J. Scholten, G. D. J. Smit, and D. B. M. Klaassen. “Surface-potential-based compact model of bulk MOSFET.” In Compact Modeling: Principles, Techniques and Applications, 3–40, 2010. https://doi.org/10.1007/978-90-481-8614-3_1.
    Full Text
  - Li, X., W. Wu, G. Gildenblat, C. C. McAndrew, and A. J. Scholten. “Benchmark tests for MOSFET compact models.” In Compact Modeling: Principles, Techniques and Applications, 75–104, 2010. https://doi.org/10.1007/978-90-481-8614-3_3.
    Full Text
- Conference Papers
  - Pan, R., X. Li, and K. Chakrabarty. “Unsupervised root-cause analysis with transfer learning for integrated systems.” In Proceedings of the Ieee Vlsi Test Symposium, Vol. 2021-April, 2021. https://doi.org/10.1109/VTS50974.2021.9441030.
    Full Text
  - Pan, R., Z. Zhang, X. Li, K. Chakrabarty, and X. Gu. “Unsupervised Root-Cause Analysis for Integrated Systems.” In Proceedings International Test Conference, Vol. 2020-November, 2020. https://doi.org/10.1109/ITC44778.2020.9325268.
    Full Text
  - Li, L., Y. Liu, T. Wei, and X. Li. “Exploring Inter-Sensor Correlation for Missing Data Estimation.” In Iecon Proceedings (Industrial Electronics Conference), 2020-October:2108–14, 2020. https://doi.org/10.1109/IECON43393.2020.9254904.
    Full Text
  - Liu, M., R. Pan, F. Ye, X. Li, K. Chakrabarty, and X. Gu. “Fine-grained Adaptive Testing Based on Quality Prediction.” In Acm Transactions on Design Automation of Electronic Systems, Vol. 25, 2020. https://doi.org/10.1145/3385261.
    Full Text
  - Nguyen, C., X. Li, and S. Blanton. “Efficient Classification via Partial Co-Training for Virtual Metrology.” In Ieee Symposium on Emerging Technologies and Factory Automation, Etfa, 2020-September:753–60, 2020. https://doi.org/10.1109/ETFA46521.2020.9212012.
    Full Text
  - Zhao, S., X. Li, and Y. C. Chen. “A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications.” In Ieee Symposium on Emerging Technologies and Factory Automation, Etfa, 2020-September:921–28, 2020. https://doi.org/10.1109/ETFA46521.2020.9211878.
    Full Text
  - Liu, M., X. Li, K. Chakrabarty, and X. Gu. “Knowledge transfer in board-level functional fault identification using domain adaptation.” In Proceedings International Test Conference, Vol. 2019-November, 2019. https://doi.org/10.1109/ITC44170.2019.9000172.
    Full Text
  - Xing, Y. L., J. Wang, X. Li, L. F. Zhu, and H. B. Zhao. “Track Circuit Signal Denoising Method Based on Q-Learning Algorithm.” In 2019 Ieee Intelligent Transportation Systems Conference, Itsc 2019, 2503–8, 2019. https://doi.org/10.1109/ITSC.2019.8917233.
    Full Text
  - Cui, G., W. Yu, X. Li, Z. Zeng, and B. Gu. “Machine-Learning-Driven Matrix Ordering for Power Grid Analysis.” In Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, Date 2019, 984–87, 2019. https://doi.org/10.23919/DATE.2019.8715086.
    Full Text
  - Liu, M., F. Ye, X. Li, K. Chakrabarty, and X. Gu. “Board-Level Functional Fault Identification using Streaming Data.” In Proceedings of the Ieee Vlsi Test Symposium, Vol. 2019-April, 2019. https://doi.org/10.1109/VTS.2019.8758599.
    Full Text
  - Pan, R., Z. Zhang, X. Li, K. Chakrabarty, and X. Gu. “Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.” In Proceedings of the Ieee Vlsi Test Symposium, Vol. 2019-April, 2019. https://doi.org/10.1109/VTS.2019.8758639.
    Full Text
  - Zhang, B., X. Li, J. Han, and X. Zeng. “MiniTracker: A Lightweight CNN-based System for Visual Object Tracking on Embedded Device.” In International Conference on Digital Signal Processing, Dsp, Vol. 2018-November, 2019. https://doi.org/10.1109/ICDSP.2018.8631813.
    Full Text
  - Liu, M., R. Pan, F. Ye, X. Li, K. Chakrabarty, and X. Gu. “Fine-Grained Adaptive Testing Based on Quality Prediction.” In Proceedings International Test Conference, Vol. 2018-October, 2019. https://doi.org/10.1109/TEST.2018.8624891.
    Full Text
  - Wei, T., X. Chen, X. Li, and Q. Zhu. “Model-based and data-driven approaches for building automation and control.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2018. https://doi.org/10.1145/3240765.3243485.
    Full Text
  - Liu, Y., and X. Li. “Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach.” In Ieee International Conference on Emerging Technologies and Factory Automation, Etfa, 2018-September:845–52, 2018. https://doi.org/10.1109/ETFA.2018.8502480.
    Full Text
  - Albalawi, Hassan, and Xin Li. “Single-Channel Real-Time Drowsiness Detection Based on Electroencephalography.” In Annual International Conference of the Ieee Engineering in Medicine and Biology Society. Ieee Engineering in Medicine and Biology Society. Annual International Conference, 2018:98–101, 2018. https://doi.org/10.1109/embc.2018.8512205.
    Full Text
  - Yu, H., and X. Li. “Intelligent corner synthesis via cycle-consistent generative adversarial networks for efficient validation of autonomous driving systems.” In Proceedings of the Asia and South Pacific Design Automation Conference, Asp Dac, 2018-January:9–15, 2018. https://doi.org/10.1109/ASPDAC.2018.8297275.
    Full Text
  - Ghai, D., X. Li, and P. Ghosal. “Message from the general chairs.” In Proceedings 2017 Ieee International Symposium on Nanoelectronic and Information Systems, Inis 2017, 2018-February:xi, 2018. https://doi.org/10.1109/iNIS.2017.5.
    Full Text
  - Alawieh, M., F. Wang, J. Tao, S. Yin, M. Jun, X. Li, T. Mukherjee, and R. Negi. “Efficient programming of reconfigurable radio frequency (RF) systems.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2017-November:772–79, 2017. https://doi.org/10.1109/ICCAD.2017.8203855.
    Full Text
  - Yu, H., C. Yan, X. Zeng, and X. Li. “Impact of circuit-level non-idealities on vision-based autonomous driving systems.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2017-November:976–83, 2017. https://doi.org/10.1109/ICCAD.2017.8203887.
    Full Text
  - Chen, X., H. B. Chen, W. Ma, X. Li, and S. X. D. Tan. “Energy-efficient wireless temperature sensoring for smart building applications.” In 2016 13th Ieee International Conference on Solid State and Integrated Circuit Technology, Icsict 2016 Proceedings, 680–83, 2017. https://doi.org/10.1109/ICSICT.2016.7999010.
    Full Text
  - Cai, Y., X. Li, J. Han, and X. Zeng. “A configurable nonlinear operation unit for neural network accelerator.” In Proceedings of International Conference on Asic, 2017-October:319–22, 2017. https://doi.org/10.1109/ASICON.2017.8252477.
    Full Text
  - Li, X., Y. Cai, J. Han, and X. Zeng. “A high utilization FPGA-based accelerator for variable-scale convolutional neural network.” In Proceedings of International Conference on Asic, 2017-October:944–47, 2017. https://doi.org/10.1109/ASICON.2017.8252633.
    Full Text
  - Nguyen, C., X. Li, and R. D. S. Blanton. “Partial Co-training for virtual metrology.” In Ieee International Conference on Emerging Technologies and Factory Automation, Etfa, 1–8, 2017. https://doi.org/10.1109/ETFA.2017.8247660.
    Full Text
  - Alawieh, M., F. Wang, and X. Li. “Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning.” In Proceedings Design Automation Conference, Vol. Part 128280, 2017. https://doi.org/10.1145/3061639.3062235.
    Full Text
  - Tao, J., H. Yu, D. Zhou, Y. Su, X. Zeng, and X. Li. “Correlated Rare Failure Analysis via Asymptotic Probability Evaluation.” In Proceedings Design Automation Conference, Vol. Part 128280, 2017. https://doi.org/10.1145/3061639.3062217.
    Full Text
  - Saragadam, V., J. Wang, X. Li, and A. C. Sankaranarayanan. “Compressive spectral anomaly detection.” In 2017 Ieee International Conference on Computational Photography, Iccp 2017 Proceedings, 2017. https://doi.org/10.1109/ICCPHOT.2017.7951482.
    Full Text
  - Lim, C., Y. Xue, X. Li, R. D. Blanton, and M. E. Amyeen. “Diagnostic resolution improvement through learning-guided physical failure analysis.” In Proceedings International Test Conference, 2017. https://doi.org/10.1109/TEST.2016.7805824.
    Full Text
  - Pandey, A., M. Jereminov, X. Li, G. Hug, and L. Pileggi. “Aggregated load and generation equivalent circuit models with semi-empirical data fitting.” In 2016 Ieee Green Energy and Systems Conference, Igsec 2016, 2016. https://doi.org/10.1109/IGESC.2016.7790066.
    Full Text
  - Pandey, A., M. Jereminov, X. Li, G. Hug, and L. Pileggi. “Unified power system analyses and models using equivalent circuit formulation.” In 2016 Ieee Power and Energy Society Innovative Smart Grid Technologies Conference, Isgt 2016, 2016. https://doi.org/10.1109/ISGT.2016.7781182.
    Full Text
  - Shi, W., M. B. Alawieh, X. Li, H. Yu, N. Arechiga, and N. Tomatsu. “Efficient statistical validation of machine learning systems for autonomous driving.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, Vol. 07-10-November-2016, 2016. https://doi.org/10.1145/2966986.2980077.
    Full Text
  - Yu, H., J. Tao, C. Liao, Y. Su, D. Zhou, X. Zeng, and X. Li. “Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, Vol. 07-10-November-2016, 2016. https://doi.org/10.1145/2966986.2967029.
    Full Text
  - Chen, X., X. Li, and S. X. D. Tan. “Overview of cyber-physical temperature estimation in smart buildings: From modeling to measurements.” In Proceedings Ieee Infocom, 2016-September:251–56, 2016. https://doi.org/10.1109/INFCOMW.2016.7562081.
    Full Text
  - Li, H. H., and X. Li. “Message from the general chairs.” In Proceedings of Ieee Computer Society Annual Symposium on Vlsi, Isvlsi, 2016-September:xvii, 2016. https://doi.org/10.1109/ISVLSI.2016.4.
    Full Text
  - Saragadam, V., A. C. Sankaranarayanan, and X. Li. “Cross-scale predictive dictionaries for image and video restoration.” In Proceedings International Conference on Image Processing, Icip, 2016-August:709–13, 2016. https://doi.org/10.1109/ICIP.2016.7532449.
    Full Text
  - Alawieh, M. B., F. Wang, and X. Li. “Identifying systematic spatial failure patterns through wafer clustering.” In Proceedings Ieee International Symposium on Circuits and Systems, 2016-July:910–13, 2016. https://doi.org/10.1109/ISCAS.2016.7527389.
    Full Text
  - Chen, X., and X. Li. “Virtual temperature measurement for smart buildings via Bayesian model fusion.” In Proceedings Ieee International Symposium on Circuits and Systems, 2016-July:950–53, 2016. https://doi.org/10.1109/ISCAS.2016.7527399.
    Full Text
  - Jereminov, M., D. M. Bromberg, A. Pandey, X. Li, G. Hug, and L. Pileggi. “An equivalent circuit formulation for three-phase power flow analysis of distribution systems.” In Proceedings of the Ieee Power Engineering Society Transmission and Distribution Conference, Vol. 2016-July, 2016. https://doi.org/10.1109/TDC.2016.7519894.
    Full Text
  - Jereminov, M., D. M. Bromberg, X. Li, G. Hug, and L. Pileggi. “Improving robustness and modeling generality for power flow analysis.” In Proceedings of the Ieee Power Engineering Society Transmission and Distribution Conference, Vol. 2016-July, 2016. https://doi.org/10.1109/TDC.2016.7520067.
    Full Text
  - Jereminov, M., A. Pandey, D. M. Bromberg, X. Li, G. Hug, and L. Pileggi. “Steady-state analysis of power system harmonics using equivalent split-circuit models.” In Ieee Pes Innovative Smart Grid Technologies Conference Europe, 2016. https://doi.org/10.1109/ISGTEurope.2016.7856199.
    Full Text
  - Fang, C., Q. Huang, F. Yang, X. Zeng, D. Zhou, and X. Li. “Efficient performance modeling of analog integrated circuits via kernel density based sparse regression.” In Proceedings Design Automation Conference, Vol. 05-09-June-2016, 2016. https://doi.org/10.1145/2897937.2898013.
    Full Text
  - Huang, Q., C. Fang, F. Yang, X. Zeng, D. Zhou, and X. Li. “Efficient performance modeling via Dual-Prior Bayesian Model Fusion for analog and mixed-signal circuits.” In Proceedings Design Automation Conference, Vol. 05-09-June-2016, 2016. https://doi.org/10.1145/2897937.2898014.
    Full Text
  - Wang, F., and X. Li. “Correlated Bayesian Model Fusion: Efficient performance modeling of large-scale tunable analog/RF integrated circuits.” In Proceedings Design Automation Conference, Vol. 05-09-June-2016, 2016. https://doi.org/10.1145/2897937.2897999.
    Full Text
  - Alawieh, M. B., F. Wang, R. Kanj, X. Li, and R. Joshi. “Efficient analog circuit optimization using sparse regression and error margining.” In Proceedings International Symposium on Quality Electronic Design, Isqed, 2016-May:410–15, 2016. https://doi.org/10.1109/ISQED.2016.7479236.
    Full Text
  - Liao, C., J. Tao, X. Zeng, Y. Su, D. Zhou, and X. Li. “Efficient spatial variation modeling via robust dictionary learning.” In Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, Date 2016, 121–26, 2016. https://doi.org/10.3850/9783981537079_0074.
    Full Text
  - Wu, P. H., M. P. H. Lin, X. Li, and T. Y. Ho. “Parasitic-aware common-centroid FinFET placement and routing for current-ratio matching.” In Acm Transactions on Design Automation of Electronic Systems, Vol. 21, 2016. https://doi.org/10.1145/2856031.
    Full Text
  - Li, C., X. Li, and P. Grover. “Energy efficient learning and classification for distributed sensing.” In 2016 8th International Conference on Communication Systems and Networks, Comsnets 2016, 2016. https://doi.org/10.1109/COMSNETS.2016.7439991.
    Full Text
  - Liu, W., H. Wang, H. Zhao, S. Wang, H. Chen, Y. Fu, J. Ma, X. Li, and S. X. D. Tan. “Thermal modeling for energy-efficient smart building with advanced overfitting mitigation technique.” In Proceedings of the Asia and South Pacific Design Automation Conference, Asp Dac, 25-28-January-2016:417–22, 2016. https://doi.org/10.1109/ASPDAC.2016.7428047.
    Full Text
  - Wang, F., S. Yin, M. Jun, X. Li, T. Mukherjee, R. Negi, and L. Pileggi. “Re-thinking polynomial optimization: Efficient programming of reconfigurable radio frequency (RF) systems by convexification.” In Proceedings of the Asia and South Pacific Design Automation Conference, Asp Dac, 25-28-January-2016:545–50, 2016. https://doi.org/10.1109/ASPDAC.2016.7428068.
    Full Text
  - Zhao, Y., H. Shin, H. Chen, S. X. D. Tan, G. Shi, and X. Li. “Statistical rare event analysis using smart sampling and parameter guidance.” In International System on Chip Conference, 2016-February:53–58, 2016. https://doi.org/10.1109/SOCC.2015.7406910.
    Full Text
  - Blanton, R. D., X. Li, K. Mai, D. Marculescu, R. Marculescu, J. Paramesh, J. Schneider, and D. E. Thomas. “Statistical learning in chip (SLIC).” In 2015 Ieee/Acm International Conference on Computer Aided Design, Iccad 2015, 664–69, 2016. https://doi.org/10.1109/ICCAD.2015.7372633.
    Full Text
  - Chen, X., X. Li, and S. X. D. Tan. “From robust chip to smart building: CAD algorithms and methodologies for uncertainty analysis of building performance.” In 2015 Ieee/Acm International Conference on Computer Aided Design, Iccad 2015, 457–64, 2016. https://doi.org/10.1109/ICCAD.2015.7372605.
    Full Text
  - Wang, F., M. Zaheer, X. Li, J. O. Plouchart, and A. Valdes-Garcia. “Co-Learning Bayesian Model Fusion: Efficient performance modeling of analog and mixed-signal circuits using side information.” In 2015 Ieee/Acm International Conference on Computer Aided Design, Iccad 2015, 575–82, 2016. https://doi.org/10.1109/ICCAD.2015.7372621.
    Full Text
  - Zhao, H., D. Quach, S. Wang, H. Wang, H. Chen, X. Li, and S. X. D. Tan. “Learning based compact thermal modeling for energy-efficient smart building management.” In 2015 Ieee/Acm International Conference on Computer Aided Design, Iccad 2015, 450–56, 2016. https://doi.org/10.1109/ICCAD.2015.7372604.
    Full Text
  - Huang, S., J. Han, X. Li, Z. Yang, and X. Zeng. “A low-cost and energy-efficient EEG processor for continuous seizure detection using wavelet transform and AdaBoost.” In Proceedings 2016 Ieee Biomedical Circuits and Systems Conference, Biocas 2016, 344–47, 2016. https://doi.org/10.1109/BioCAS.2016.7833802.
    Full Text
  - Plouchart, J. O., F. Wang, A. Balteanu, B. Parker, M. A. T. Sanduleanu, M. Yeck, V. H. C. Chen, et al. “A 18mW, 3.3dB NF, 60GHz LNA in 32nm SOI CMOS technology with autonomic NF calibration.” In Digest of Papers Ieee Radio Frequency Integrated Circuits Symposium, 2015-November:319–22, 2015. https://doi.org/10.1109/RFIC.2015.7337769.
    Full Text
  - Sun, S., and X. Li. “Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space.” In Proceedings of the Custom Integrated Circuits Conference, Vol. 2015-November, 2015. https://doi.org/10.1109/CICC.2015.7338409.
    Full Text
  - Chen, X., D. Bromberg, X. Li, L. Pileggi, and G. Hug. “A robust and efficient power series method for tracing PV curves.” In 2015 North American Power Symposium, Naps 2015, 2015. https://doi.org/10.1109/NAPS.2015.7335124.
    Full Text
  - Bromberg, D. M., M. Jereminov, X. Li, G. Hug, and L. Pileggi. “An equivalent circuit formulation of the power flow problem with current and voltage state variables.” In 2015 Ieee Eindhoven Powertech, Powertech 2015, 2015. https://doi.org/10.1109/PTC.2015.7232632.
    Full Text
  - Huang, Q., C. Fang, F. Yang, X. Zeng, and X. Li. “Efficient multivariate moment estimation via Bayesian model fusion for analog and mixed-signal circuits.” In Proceedings Design Automation Conference, Vol. 2015-June, 2015. https://doi.org/10.1145/2744769.2744832.
    Full Text
  - Jeong, H., M. Won, W. Shi, J. A. Weldon, X. Li, and K. Wang. “Feasibility study of a dual-gate photosensitive thin-film transistor for fingerprint sensor integrated active-matrix display.” In Digest of Technical Papers Sid International Symposium, 46:1131–34, 2015. https://doi.org/10.1002/sdtp.10029.
    Full Text
  - Liu, B., W. Wen, Y. Chen, X. Li, C. R. Wu, and T. Y. Ho. “EDA challenges for memristor-crossbar based neuromorphic computing.” In Proceedings of the Acm Great Lakes Symposium on Vlsi, Glsvlsi, 20-22-May-2015:185–88, 2015. https://doi.org/10.1145/2742060.2743754.
    Full Text
  - Fang, C., Q. Huang, F. Yang, X. Zeng, X. Li, and C. Gu. “Efficient bit error rate estimation for high-speed link by Bayesian model fusion.” In Proceedings Design, Automation and Test in Europe, Date, 2015-April:1024–29, 2015. https://doi.org/10.7873/date.2015.0025.
    Full Text
  - Goncalves, H., X. Li, M. Correia, V. Tavares, J. Carulli, and K. Butler. “A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.” In Proceedings Design, Automation and Test in Europe, Date, 2015-April:1042–47, 2015. https://doi.org/10.7873/date.2015.0690.
    Full Text
  - Liaperdos, J., H. G. Stratigopoulos, L. Abdallah, Y. Tsiatouhas, A. Arapoyanni, and X. Li. “Fast deployment of alternate analog test using Bayesian model fusion.” In Proceedings Design, Automation and Test in Europe, Date, 2015-April:1030–35, 2015. https://doi.org/10.7873/date.2015.0102.
    Full Text
  - Wu, P. H., M. P. H. Lin, X. Li, and T. Y. Ho. “Common-centroid FinFET placement considering the impact of gate misalignment.” In Proceedings of the International Symposium on Physical Design, 29-March-2015:25–31, 2015. https://doi.org/10.1145/2717764.2717769.
    Full Text
  - Zhang, S., X. Li, R. D. S. Blanton, J. M. Da Silva, J. M. Carulli, and K. M. Butler. “Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.” In Proceedings International Test Conference, Vol. 2015-February, 2015. https://doi.org/10.1109/TEST.2014.7035328.
    Full Text
  - Blanton, R. D., X. Li, K. Mai, D. Marculescu, R. Marculescu, J. Paramesh, J. Schneider, and D. E. Thomas. “SLIC: Statistical learning in chip.” In Proceedings of the 14th International Symposium on Integrated Circuits, Isic 2014, 119–23, 2015. https://doi.org/10.1109/ISICIR.2014.7029574.
    Full Text
  - Li, X., R. D. S. Blanton, P. Grover, and D. E. Thomas. “Ultra-low-power biomedical circuit design and optimization: Catching the don't cares.” In Proceedings of the 14th International Symposium on Integrated Circuits, Isic 2014, 115–18, 2015. https://doi.org/10.1109/ISICIR.2014.7029551.
    Full Text
  - Liu, B., H. Li, Y. Chen, X. Li, T. Huang, Q. Wu, and M. Barnell. “Reduction and IR-drop compensations techniques for reliable neuromorphic computing systems.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2015-January:63–70, 2015. https://doi.org/10.1109/ICCAD.2014.7001330.
    Full Text
  - Sun, S., and X. Li. “Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2015-January:324–31, 2015. https://doi.org/10.1109/ICCAD.2014.7001370.
    Full Text
  - Zaheer, M., X. Li, and C. Gu. “MPME-DP: Multi-population moment estimation via dirichlet process for efficient validation of analog/mixed-signal circuits.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2015-January:316–23, 2015. https://doi.org/10.1109/ICCAD.2014.7001369.
    Full Text
  - Huang, Q., X. Li, F. Yang, and X. Zeng. “SIPredict: Efficient post-layout waveform prediction via System Identification.” In 20th Asia and South Pacific Design Automation Conference, Asp Dac 2015, 460–65, 2015. https://doi.org/10.1109/ASPDAC.2015.7059049.
    Full Text
  - Jun, M., R. Negi, S. Yin, F. Wang, M. Sunny, T. Mukherjee, and X. Li. “Phase noise impairment and environment-adaptable fast (EAF) optimization for programming of reconfigurable radio frequency (RF) receivers.” In 2015 Ieee Global Communications Conference, Globecom 2015, 2015. https://doi.org/10.1109/GLOCOM.2014.7417832.
    Full Text
  - Liu, B., H. Li, Y. Chen, X. Li, Q. Wu, and T. Huang. “Vortex: Variation-aware training for memristor X-bar.” In Proceedings Design Automation Conference, Vol. 2015-July, 2015. https://doi.org/10.1145/2744769.2744930.
    Full Text
  - Sun, S., and X. Li. “Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space.” In 20th Asia and South Pacific Design Automation Conference, Asp Dac 2015, 302–7, 2015. https://doi.org/10.1109/ASPDAC.2015.7059022.
    Full Text
  - Wang, Y. C., S. Yin, M. Jun, X. Li, L. T. Pileggi, T. Mukherjee, and R. Negi. “Accurate passivity-enforced macromodeling for RF circuits via iterative zero/pole update based on measurement data.” In 20th Asia and South Pacific Design Automation Conference, Asp Dac 2015, 441–46, 2015. https://doi.org/10.1109/ASPDAC.2015.7059046.
    Full Text
  - Wen, W., C. R. Wu, X. Hu, B. Liu, T. Y. Ho, X. Li, and Y. Chen. “An EDA framework for large scale hybrid neuromorphic computing systems.” In Proceedings Design Automation Conference, Vol. 2015-July, 2015. https://doi.org/10.1145/2744769.2744795.
    Full Text
  - Zaheer, M., F. Wang, C. Gu, and X. Li. “MTunes: Efficient post-silicon tuning of mixed-signal/RF integrated circuits based on Markov decision process.” In Proceedings Design Automation Conference, Vol. 2015-July, 2015. https://doi.org/10.1145/2744769.2744873.
    Full Text
  - Tao, J., Y. C. Wang, M. Jun, X. Li, R. Negi, T. Mukherjee, and L. T. Pileggi. “Toward efficient programming of reconfigurable radio frequency (RF) receivers.” In Proceedings of the Asia and South Pacific Design Automation Conference, Asp Dac, 256–61, 2014. https://doi.org/10.1109/ASPDAC.2014.6742899.
    Full Text
  - Jun, M., R. Negi, Y. C. Wang, T. Mukherjee, X. Li, J. Tao, and L. Pileggi. “Joint invariant estimation of RF impairments for reconfigurable Radio Frequency(RF) front-end.” In 2014 Ieee Globecom Workshops, Gc Wkshps 2014, 954–59, 2014. https://doi.org/10.1109/GLOCOMW.2014.7063556.
    Full Text
  - Mahzoon, M., H. Albalawi, X. Li, and P. Grover. “Using relative-relevance of data pieces for efficient communication, with an application to Neural data acquisition.” In 2014 52nd Annual Allerton Conference on Communication, Control, and Computing, Allerton 2014, 160–66, 2014. https://doi.org/10.1109/ALLERTON.2014.7028451.
    Full Text
  - Gonçalves, H., M. Correia, X. Li, A. Sankaranarayanan, and V. Tavares. “DALM-SVD: Accelerated sparse coding through singular value decomposition of the dictionary.” In 2014 Ieee International Conference on Image Processing, Icip 2014, 4907–11, 2014. https://doi.org/10.1109/ICIP.2014.7025994.
    Full Text
  - Albalawi, H., Y. Li, and X. Li. “Computer-aided design of machine learning algorithm: Training fixed-point classifier for on-chip low-power implementation.” In Proceedings Design Automation Conference, 2014. https://doi.org/10.1145/2593069.2593110.
    Full Text
  - Baker, K., G. Hug, and X. Li. “Optimal storage sizing using two-stage stochastic optimization for intra-hourly dispatch.” In 2014 North American Power Symposium, Naps 2014, 2014. https://doi.org/10.1109/NAPS.2014.6965384.
    Full Text
  - Fang, C., F. Yang, X. Zeng, and X. Li. “BMF-BD: Bayesian model fusion on bernoulli distribution for efficient yield estimation of integrated circuits.” In Proceedings Design Automation Conference, 2014. https://doi.org/10.1145/2593069.2593099.
    Full Text
  - Jun, M., R. Negi, J. Tao, Y. C. Wang, S. Yin, T. Mukherjee, X. Li, and L. Pileggi. “Environment-adaptable efficient optimization for programming of reconfigurable radio frequency (RF) receivers.” In Proceedings Ieee Military Communications Conference Milcom, 1459–65, 2014. https://doi.org/10.1109/MILCOM.2014.241.
    Full Text
  - Li, M., and X. Li. “Verification based ECG biometrics with cardiac irregular conditions using heartbeat level and segment level information fusion.” In Icassp, Ieee International Conference on Acoustics, Speech and Signal Processing Proceedings, 3769–73, 2014. https://doi.org/10.1109/ICASSP.2014.6854306.
    Full Text
  - Minho Won, Sophia J., Hassan Albalawi, Hassan Xin Li, and Donald E. Thomas. “Low-power hardware implementation of movement decoding for brain computer interface with reduced-resolution discrete cosine transform.” In Annual International Conference of the Ieee Engineering in Medicine and Biology Society. Ieee Engineering in Medicine and Biology Society. Annual International Conference, 2014:1626–29, 2014. https://doi.org/10.1109/embc.2014.6943916.
    Full Text
  - Baker, K., D. Zhu, G. Hug, and X. Li. “Jacobian singularities in optimal power flow problems caused by intertemporal constraints.” In 45th North American Power Symposium, Naps 2013, 2013. https://doi.org/10.1109/NAPS.2013.6666876.
    Full Text
  - Blanton, R. D., F. Wang, C. Xue, P. K. Nag, Y. Xue, and X. Li. “DREAMS: DFM rule evaluation using manufactured silicon.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 99–106, 2013. https://doi.org/10.1109/ICCAD.2013.6691104.
    Full Text
  - Hsu, C. K., F. Lin, K. T. Cheng, W. Zhang, X. Li, J. M. Carulli, and K. M. Butler. “Test data analytics - Exploring spatial and test-item correlations in production test data.” In Proceedings International Test Conference, 2013. https://doi.org/10.1109/TEST.2013.6651900.
    Full Text
  - Li, X., F. Wang, S. Sun, and C. Gu. “Bayesian Model Fusion: A statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 795–802, 2013. https://doi.org/10.1109/ICCAD.2013.6691204.
    Full Text
  - Sun, S., X. Li, H. Liu, K. Luo, and B. Gu. “Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 478–85, 2013. https://doi.org/10.1109/ICCAD.2013.6691160.
    Full Text
  - Xue, Y., O. Poku, X. Li, and R. D. Blanton. “PADRE: Physically-aware diagnostic resolution enhancement.” In Proceedings International Test Conference, 2013. https://doi.org/10.1109/TEST.2013.6651899.
    Full Text
  - Sun, S., F. Wang, S. Yaldiz, X. Li, L. Pileggi, A. Natarajan, M. Ferriss, et al. “Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion.” In Proceedings of the Custom Integrated Circuits Conference, 2013. https://doi.org/10.1109/CICC.2013.6658489.
    Full Text
  - Sun, S., X. Li, and C. Gu. “Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits.” In Proceedings of the Custom Integrated Circuits Conference, 2013. https://doi.org/10.1109/CICC.2013.6658463.
    Full Text
  - Krieger, D., M. McNeil, J. Zhang, W. Schneider, X. Li, and D. O. Okonkwo. “Referee consensus: A platform technology for nonlinear optimization.” In Acm International Conference Proceeding Series, 2013. https://doi.org/10.1145/2484762.2484789.
    Full Text
  - Gu, C., E. Chiprout, and X. Li. “Efficient moment estimation with extremely small sample size via bayesian inference for analog/mixed-signal validation.” In Proceedings Design Automation Conference, 2013. https://doi.org/10.1145/2463209.2488813.
    Full Text
  - Wang, F., W. Zhang, S. Sun, X. Li, and C. Gu. “Bayesian model fusion: Large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.” In Proceedings Design Automation Conference, 2013. https://doi.org/10.1145/2463209.2488812.
    Full Text
  - Zhang, W., X. Li, S. Saxena, A. Strojwas, and R. Rutenbar. “Automatic clustering of wafer spatial signatures.” In Proceedings Design Automation Conference, 2013. https://doi.org/10.1145/2463209.2488821.
    Full Text
  - Baker, K., G. Hug, and X. Li. “Optimal integration of intermittent energy sources using distributed multi-step optimization.” In Ieee Power and Energy Society General Meeting, 2012. https://doi.org/10.1109/PESGM.2012.6344712.
    Full Text
  - Baker, K., G. Hug, and X. Li. “Inclusion of inter-temporal constraints into a distributed Newton-Raphson method.” In 2012 North American Power Symposium, Naps 2012, 2012. https://doi.org/10.1109/NAPS.2012.6336344.
    Full Text
  - Li, X., W. Zhang, and F. Wang. “Large-scale statistical performance modeling of analog and mixed-signal circuits.” In Proceedings of the Custom Integrated Circuits Conference, 2012. https://doi.org/10.1109/CICC.2012.6330570.
    Full Text
  - Yu, B., X. Li, J. Yonemura, Z. Wu, J. S. Goo, C. Thuruthiyil, and A. Icel. “Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables.” In Proceedings of the Custom Integrated Circuits Conference, 2012. https://doi.org/10.1109/CICC.2012.6330573.
    Full Text
  - Zhang, W., K. Balakrishnan, X. Li, D. Boning, E. Acar, F. Liu, and R. A. Rutenbar. “Spatial variation decomposition via sparse regression.” In Icicdt 2012 Ieee International Conference on Integrated Circuit Design and Technology, 2012. https://doi.org/10.1109/ICICDT.2012.6232875.
    Full Text
  - Wang, F., G. Keskin, A. Phelps, J. Rotner, X. Li, G. K. Fedder, T. Mukherjee, and L. T. Pileggi. “Statistical design and optimization for adaptive post-silicon tuning of MEMS filters.” In Proceedings Design Automation Conference, 176–81, 2012. https://doi.org/10.1145/2228360.2228395.
    Full Text
  - Zhou, H., X. Li, C. Y. Cher, E. Kursun, H. Qian, and S. C. Yao. “An information-theoretic framework for optimal temperature sensor allocation and full-chip thermal monitoring.” In Proceedings Design Automation Conference, 642–47, 2012. https://doi.org/10.1145/2228360.2228476.
    Full Text
  - Juan, D. C., H. Zhou, D. Marculescu, and X. Li. “A learning-based autoregressive model for fast transient thermal analysis of chip-multiprocessors.” In Proceedings of the Asia and South Pacific Design Automation Conference, Asp Dac, 597–602, 2012. https://doi.org/10.1109/ASPDAC.2012.6165027.
    Full Text
  - Li, X. “Post-silicon performance modeling and tuning of analog/mixed-signal circuits via bayesian model fusion.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 551–52, 2012. https://doi.org/10.1145/2429384.2429503.
    Full Text
  - Li, X., W. Zhang, F. Wang, S. Sun, and C. Gu. “Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 627–34, 2012. https://doi.org/10.1145/2429384.2429519.
    Full Text
  - Althoff, M., S. Yaldiz, A. Rajhans, X. Li, B. H. Krogh, and L. Pileggi. “Formal verification of phase-locked loops using reachability analysis and continuization.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 659–66, 2011. https://doi.org/10.1109/ICCAD.2011.6105400.
    Full Text
  - Chang, H. M., K. T. Cheng, W. Zhang, X. Li, and K. M. Butler. “Test cost reduction through performance prediction using virtual probe.” In Proceedings International Test Conference, 2011. https://doi.org/10.1109/TEST.2011.6139129.
    Full Text
  - Zhang, W., K. Balakrishnan, X. Li, D. Boning, and R. Rutenbar. “Toward efficient spatial variation decomposition via sparse regression.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 162–69, 2011. https://doi.org/10.1109/ICCAD.2011.6105321.
    Full Text
  - Yaldiz, S., V. Calayir, X. Li, L. Pileggi, A. S. Natarajan, M. A. Ferriss, and J. Tierno. “Indirect phase noise sensing for self-healing voltage controlled oscillators.” In Proceedings of the Custom Integrated Circuits Conference, 2011. https://doi.org/10.1109/CICC.2011.6055416.
    Full Text
  - Feng, J., A. L. S. Loke, T. T. Wee, C. O. Lackey, L. A. Okada, C. T. Schwan, T. Mantei, et al. “Bridging design and manufacture of analog/mixed-signal circuits in advanced CMOS.” In Digest of Technical Papers Symposium on Vlsi Technology, 226–27, 2011.
  - Li, X. “Rethinking memory redundancy: Optimal bit cell repair for maximum-information storage.” In Proceedings Design Automation Conference, 316–21, 2011.
  - Dong, C., and X. Li. “Efficient SRAM failure rate prediction via Gibbs sampling.” In Proceedings Design Automation Conference, 200–205, 2011. https://doi.org/10.1145/2024724.2024769.
    Full Text
  - Sun, P., X. Li, and M. Y. Ting. “Efficient incremental analysis of on-chip power grid via sparse approximation.” In Proceedings Design Automation Conference, 676–81, 2011. https://doi.org/10.1145/2024724.2024878.
    Full Text
  - Li, X., J. Fu, Y. Huang, and Z. Hong. “A 130nm CMOS direct conversion transmitter for WCDMA.” In Icsict 2010 2010 10th Ieee International Conference on Solid State and Integrated Circuit Technology, Proceedings, 684–86, 2010. https://doi.org/10.1109/ICSICT.2010.5667373.
    Full Text
  - Zhang, W., T. H. Chen, M. Y. Ting, and X. Li. “Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression.” In Proceedings Design Automation Conference, 897–902, 2010. https://doi.org/10.1145/1837274.1837500.
    Full Text
  - Zhang, W., X. Li, and R. A. Rutenbar. “Bayesian Virtual Probe: Minimizing variation characterizationcost for nanoscale IC technologies via Bayesian inference.” In Proceedings Design Automation Conference, 262–67, 2010. https://doi.org/10.1145/1837274.1837342.
    Full Text
  - Li, X. “Maximum-information storage system: Concept, implementation and application.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 39–46, 2010. https://doi.org/10.1109/ICCAD.2010.5653971.
    Full Text
  - Zhang, W., X. Li, E. Acar, F. Liu, and R. Rutenbar. “Multi-wafer virtual probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 47–54, 2010. https://doi.org/10.1109/ICCAD.2010.5654349.
    Full Text
  - Li, X. “Large-scale analog/RF performance modeling by statistical regression.” In Asicon 2009 Proceedings 2009 8th Ieee International Conference on Asic, 646–49, 2009. https://doi.org/10.1109/ASICON.2009.5351329.
    Full Text
  - Li, X., R. R. Rutenbar, and R. D. Blanton. “Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 433–40, 2009.
  - Gildenblat, G., W. Wu, X. Li, Z. Zhu, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassen. “Surface-potential-based MOSFET models with introduction to PSP.” In 2009 Ieee 10th Annual Wireless and Microwave Technology Conference, Wamicon 2009, 2009. https://doi.org/10.1109/WAMICON.2009.5207226.
    Full Text
  - Hong, Z., T. H. Chen, M. Y. Ting, and X. Li. “Efficient design-specific worst-case corner extraction for integrated circuits.” In Proceedings Design Automation Conference, 386–89, 2009.
  - Li, X. “Finding deterministic solution from underdetermined equation: Large-scale performance modeling by least angle regression.” In Proceedings Design Automation Conference, 364–69, 2009.
  - Zhou, Q., W. Yao, W. Wu, X. Li, Z. Zhu, and G. Gildenblat. “Parameter extracttion for the PSP MOSFET model by the combination of genetic and levenberg-marquardt algorithms.” In Ieee International Conference on Microelectronic Test Structures, 137–42, 2009. https://doi.org/10.1109/ICMTS.2009.4814627.
    Full Text
  - Zhu, Z., J. Victory, S. Chaudhry, L. Dong, Z. Yant, J. Zheng, W. Wu, et al. “Improved parameter extraction procedure for PSP-based MOS varactor model.” In Ieee International Conference on Microelectronic Test Structures, 148–53, 2009. https://doi.org/10.1109/ICMTS.2009.4814629.
    Full Text
  - Yaldiz, S., U. Arslan, X. Li, and L. Pileggi. “Efficient statistical analysis of read timing failures in sram circuits.” In Proceedings of the 10th International Symposium on Quality Electronic Design, Isqed 2009, 617–21, 2009. https://doi.org/10.1109/ISQED.2009.4810365.
    Full Text
  - Scholten, A. J., G. D. J. Smit, B. A. De Vries, L. F. Tiemeijer, J. A. Croon, D. B. M. Klaassen, R. Van Langevelde, X. Li, W. Wu, and G. Gildenblat. “The new CMC standard compact MOS model PSP: Advantages for RF applications.” In Ieee Journal of Solid State Circuits, 44:1415–24, 2009. https://doi.org/10.1109/JSSC.2009.2015821.
    Full Text
  - Wang, J., S. Yaldiz, X. Li, and L. T. Pileggi. “SRAM parametric failure analysis.” In Proceedings Design Automation Conference, 496–501, 2009. https://doi.org/10.1145/1629911.1630041.
    Full Text
  - Arslan, U., M. P. McCartney, M. Bhargava, X. Li, K. Mai, and L. T. Pileggi. “Variation-tolerant SRAM sense-amplifier timing using configurable replica bitlines.” In Proceedings of the Custom Integrated Circuits Conference, 415–18, 2008. https://doi.org/10.1109/CICC.2008.4672108.
    Full Text
  - Pileggi, L., G. Keskin, X. Li, K. Mai, and J. Proesel. “Mismatch analysis and statistical design at 65 nm and below.” In Proceedings of the Custom Integrated Circuits Conference, 9–12, 2008. https://doi.org/10.1109/CICC.2008.4672006.
    Full Text
  - Wu, W., X. Li, G. Gildenblat, G. O. Workman, S. Veeraraghavan, and J. Watts. “A nonlinear body resistance model for accurate PD/SOI technology characterization.” In Proceedings Ieee International Soi Conference, 151–52, 2008. https://doi.org/10.1109/SOI.2008.4656339.
    Full Text
  - Schölten, A. J., G. D. J. Smit, B. A. De Vries, L. F. Tiemeijer, J. A. Croon, D. B. M. Klaassen, R. Van Langevelde, X. Li, W. Wu, and G. Gildenblat. “(Invited) the new CMC standard compact MOS model PSP: Advantages for RF applications.” In Digest of Papers Ieee Radio Frequency Integrated Circuits Symposium, 247–50, 2008. https://doi.org/10.1109/RFIC.2008.4561428.
    Full Text
  - Li, X., and H. Liu. “Statistical regression for efficient high-dimensional modeling of analog and mixed-signal performance variations.” In Proceedings Design Automation Conference, 38–43, 2008. https://doi.org/10.1109/DAC.2008.4555778.
    Full Text
  - Li, X., and Y. Cao. “Projection-based piecewise-linear response surface modeling for strongly nonlinear VLSI performance variations.” In Proceedings of the 9th International Symposium on Quality Electronic Design, Isqed 2008, 108–13, 2008. https://doi.org/10.1109/ISQED.2008.4479708.
    Full Text
  - Li, X., J. Le, M. Celik, and L. T. Pileggi. “Defining statistical timing sensitivity for logic circuits with large-scale process and environmental variations.” In Ieee Transactions on Computer Aided Design of Integrated Circuits and Systems, 27:1041–54, 2008. https://doi.org/10.1109/TCAD.2008.923241.
    Full Text
  - Li, X., B. Taylor, Y. T. Chien, and L. T. Pileggi. “Adaptive post-silicon tuning for analog circuits: Concept, analysis and optimization.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 450–57, 2007. https://doi.org/10.1109/ICCAD.2007.4397306.
    Full Text
  - Li, X., W. Wu, A. Jha, G. Gildenblat, R. Van Langevelde, G. D. J. Smit, A. J. Scholten, et al. “Benchmarking the PSP compact model for MOS transistors.” In Ieee International Conference on Microelectronic Test Structures, 259–64, 2007. https://doi.org/10.1109/ICMTS.2007.374495.
    Full Text
  - Li, X., and L. T. Pileggi. “Efficient parametric yield extraction for multiple correlated non-normal performance distributions of analog/RF circuits.” In Proceedings Design Automation Conference, 928–33, 2007. https://doi.org/10.1109/DAC.2007.375297.
    Full Text
  - Wang, J., X. Li, and L. T. Pileggi. “Parameterized macromodeling for analog system-level design exploration.” In Proceedings Design Automation Conference, 940–43, 2007. https://doi.org/10.1109/DAC.2007.375299.
    Full Text
  - Wu, W., X. Li, G. Gildenblat, G. Workman, S. Veeraraghavan, C. McAndrew, R. Van Langevelde, et al. “PSP-SOI: A surface potential based compact model of partially depleted SOI MOSFETs.” In Proceedings of the Custom Integrated Circuits Conference, 41–48, 2007. https://doi.org/10.1109/CICC.2007.4405678.
    Full Text
  - Gildenblat, G., X. Li, H. Wang, W. Wu, A. Jha, R. Van Langevelde, A. J. Scholten, G. D. J. Smit, and D. B. M. Klaassen. “Theory and modeling techniques used in the PSP model.” In 2006 Nsti Nanotechnology Conference and Trade Show Nsti Nanotech 2006 Technical Proceedings, 3:604–9, 2006.
  - Gopalakrishnan, P., X. Li, and L. Pileggi. “Architecture-aware FPGA placement using metric embedding.” In Proceedings Design Automation Conference, 460–65, 2006. https://doi.org/10.1145/1146909.1147033.
    Full Text
  - Keskin, G., X. Li, and L. Pileggi. “Active on-die suppression of power supply noise.” In Proceedings of the Custom Integrated Circuits Conference, 813–16, 2006. https://doi.org/10.1109/CICC.2006.321012.
    Full Text
  - Li, X., J. Le, and L. T. Pileggi. “Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions.” In Proceedings Design Automation Conference, 103–8, 2006. https://doi.org/10.1145/1146909.1146941.
    Full Text
  - Li, P., F. Liu, X. Li, L. T. Pileggi, and S. R. Nassif. “Modeling interconnect variability using efficient parametric model order reduction.” In Proceedings Design, Automation and Test in Europe, Date ’05, II:958–63, 2005. https://doi.org/10.1109/DATE.2005.213.
    Full Text
  - Li, X., J. Le, L. T. Pileggi, and A. Strojwas. “Projection-based performance modeling for inter/intra-die variations.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2005:720–26, 2005. https://doi.org/10.1109/ICCAD.2005.1560160.
    Full Text
  - Xu, Y., I. Nausieda, K. L. Hsiung, S. Boyd, X. Li, and L. Pileggi. “OPERA: Optimization with ellipsoidal uncertainty for robust analog IC design.” In Proceedings Design Automation Conference, 632–37, 2005.
  - Li, X., J. Le, M. Celik, and L. T. Pileggi. “Defining statistical sensitivity for timing optimization of logic circuits with large-scale process and environmental variations.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2005:844–51, 2005. https://doi.org/10.1109/ICCAD.2005.1560180.
    Full Text
  - Li, X., J. Wang, L. T. Pileggi, T. S. Chen, and W. Chiang. “Performance-centering optimization for system-level analog design exploration.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2005:422–29, 2005. https://doi.org/10.1109/ICCAD.2005.1560105.
    Full Text
  - Wang, H., X. Li, W. Wu, G. Gildenblat, R. Van Langevelde, G. D. J. Smit, A. J. Scholten, and D. B. M. Klaassent. “Unified non-quasi-static MOSFET model for large-signal and small-signal simulations.” In Proceedings of the Custom Integrated Circuits Conference, 2005:823–26, 2005. https://doi.org/10.1109/CICC.2005.1568796.
    Full Text
  - Wu, W., X. Li, H. Wang, G. Gildenblat, G. Workman, S. Veeraraghavan, and C. McAndrew. “SP-SOI: A third generation surface potential based compact SOI MOSFET model.” In Proceedings of the Custom Integrated Circuits Conference, 2005:819–22, 2005. https://doi.org/10.1109/CICC.2005.1568795.
    Full Text
  - Zhan, Y., A. J. Strojwas, X. Li, L. T. Pileggi, D. Newmark, and M. Sharma. “Correlation-aware statistical timing analysis with non-gaussian delay distributions.” In Proceedings Design Automation Conference, 77–82, 2005. https://doi.org/10.1109/dac.2005.193777.
    Full Text
  - Li, X., J. Le, P. Gopalakrishnan, and L. T. Pileggi. “Asymptotic probability extraction for non-normal distributions of circuit performance.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 2–9, 2004.
  - Li, X., P. Gopalakrishnan, Y. Xu, and L. T. Pileggi. “Robust analog/RF circuit design with projection-based posynomial modeling.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, Iccad, 855–62, 2004.
  - Le, J., X. Li, and L. T. Pileggi. “STAC: Statistical timing analysis with correlation.” In Proceedings Design Automation Conference, 343–48, 2004.
  - Li, X., Y. Xu, P. Li, P. Gopalakrishnan, and L. T. Pileggi. “A frequency relaxation approach for analog/RF system-level simulation.” In Proceedings Design Automation Conference, 842–47, 2004. https://doi.org/10.1145/996566.996792.
    Full Text
  - Li, P., X. Li, Y. Xu, and L. T. Pileggi. “A Hybrid Approach to Nonlinear Macromodel Generation for Time-Varying Analog Circuits.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, 454–61, 2003.
  - Xu, Y., X. Li, P. Li, and L. Pileggi. “Noise macromodel for radio frequency integrated circuits.” In Proceedings Design, Automation and Test in Europe, Date, 150–55, 2003. https://doi.org/10.1109/DATE.2003.1253601.
    Full Text
  - Xu, Y., X. Li, P. Li, and L. Pileggi. “Noise macromodel for radio frequency integrated circuits.” In Proceedings Design, Automation and Test in Europe, Date, 150–55, 2003. https://doi.org/10.1109/DATE.2003.1186379.
    Full Text
  - Li, X., P. Li, Y. Xu, R. Dimaggio, and L. Pileggi. “A frequency separation macromodel for system-level simulation of RF circuits.” In Proceedings of the Asia and South Pacific Design Automation Conference, Asp Dac, 2003-January:891–96, 2003. https://doi.org/10.1109/ASPDAC.2003.1195143.
    Full Text
  - Li, X., P. Li, Y. Xu, and L. T. Pileggi. “Analog and RF circuit macromodels for system-level analysis.” In Proceedings Design Automation Conference, 478–83, 2003. https://doi.org/10.1145/775954.775956.
    Full Text
  - Li, X., X. Zeng, D. Zhou, and X. Ling. “Wavelet method for high-speed clock tree simulation.” In Proceedings Ieee International Symposium on Circuits and Systems, Vol. 1, 2002.
  - Li, X., B. Hu, X. Ling, and X. Zeng. “A wavelet balance approach for steady-state analysis of nonlinear circuits.” In Iscas 2001 2001 Ieee International Symposium on Circuits and Systems, Conference Proceedings, 3:73–76, 2001. https://doi.org/10.1109/ISCAS.2001.921249.
    Full Text
  - Li, X., X. Zeng, D. Zhou, and X. Ling. “Behavioral modeling of analog circuits by wavelet collocation method.” In Ieee/Acm International Conference on Computer Aided Design, Digest of Technical Papers, 65–69, 2001.
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