Loading and characterization of a printed-circuit-board atomic ion trap
Publication
, Journal Article
Brown, KR; Clark, RJ; Labaziewicz, J; Richerme, P; Leibrandt, DR; Chuang, IL
Published in: Physical Review A - Atomic, Molecular, and Optical Physics
January 30, 2007
We demonstrate loading of Sr+88 ions into a 0.5-mm -scale printed circuit board surface-electrode ion trap. We then characterize the trap by measuring the secular frequencies and comparing them to a three-dimensional simulation of the trap, and by measuring the stray electric fields along two of the trap’s principal axes. Cancelling these fields by applying additional voltages enables a hundredfold increase in the trap lifetime to greater than ten minutes at a vacuum of 10a 9 torr. © 2007 The American Physical Society.
Duke Scholars
Published In
Physical Review A - Atomic, Molecular, and Optical Physics
DOI
EISSN
1094-1622
ISSN
1050-2947
Publication Date
January 30, 2007
Volume
75
Issue
1
Related Subject Headings
- General Physics
- 03 Chemical Sciences
- 02 Physical Sciences
- 01 Mathematical Sciences
Citation
APA
Chicago
ICMJE
MLA
NLM
Brown, K. R., Clark, R. J., Labaziewicz, J., Richerme, P., Leibrandt, D. R., & Chuang, I. L. (2007). Loading and characterization of a printed-circuit-board atomic ion trap. Physical Review A - Atomic, Molecular, and Optical Physics, 75(1). https://doi.org/10.1103/PhysRevA.75.015401
Published In
Physical Review A - Atomic, Molecular, and Optical Physics
DOI
EISSN
1094-1622
ISSN
1050-2947
Publication Date
January 30, 2007
Volume
75
Issue
1
Related Subject Headings
- General Physics
- 03 Chemical Sciences
- 02 Physical Sciences
- 01 Mathematical Sciences