Special session on reliability and vulnerability of neuromorphic computing systems
Publication
, Conference
Yu, S; Liu, C; Wen, W; Chen, Y
Published in: Proceedings of the IEEE VLSI Test Symposium
May 29, 2018
This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.
Duke Scholars
Published In
Proceedings of the IEEE VLSI Test Symposium
DOI
Publication Date
May 29, 2018
Volume
2018-April
Start / End Page
1
Citation
APA
Chicago
ICMJE
MLA
NLM
Yu, S., Liu, C., Wen, W., & Chen, Y. (2018). Special session on reliability and vulnerability of neuromorphic computing systems. In Proceedings of the IEEE VLSI Test Symposium (Vol. 2018-April, p. 1). https://doi.org/10.1109/VTS.2018.8368633
Yu, S., C. Liu, W. Wen, and Y. Chen. “Special session on reliability and vulnerability of neuromorphic computing systems.” In Proceedings of the IEEE VLSI Test Symposium, 2018-April:1, 2018. https://doi.org/10.1109/VTS.2018.8368633.
Yu S, Liu C, Wen W, Chen Y. Special session on reliability and vulnerability of neuromorphic computing systems. In: Proceedings of the IEEE VLSI Test Symposium. 2018. p. 1.
Yu, S., et al. “Special session on reliability and vulnerability of neuromorphic computing systems.” Proceedings of the IEEE VLSI Test Symposium, vol. 2018-April, 2018, p. 1. Scopus, doi:10.1109/VTS.2018.8368633.
Yu S, Liu C, Wen W, Chen Y. Special session on reliability and vulnerability of neuromorphic computing systems. Proceedings of the IEEE VLSI Test Symposium. 2018. p. 1.
Published In
Proceedings of the IEEE VLSI Test Symposium
DOI
Publication Date
May 29, 2018
Volume
2018-April
Start / End Page
1