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Special session on reliability and vulnerability of neuromorphic computing systems

Publication ,  Conference
Yu, S; Liu, C; Wen, W; Chen, Y
Published in: Proceedings of the IEEE VLSI Test Symposium
May 29, 2018

This is the summary of the special session on reliability and vulnerability of neuromorphic computing systems.

Duke Scholars

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

Publication Date

May 29, 2018

Volume

2018-April

Start / End Page

1
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Yu, S., Liu, C., Wen, W., & Chen, Y. (2018). Special session on reliability and vulnerability of neuromorphic computing systems. In Proceedings of the IEEE VLSI Test Symposium (Vol. 2018-April, p. 1). https://doi.org/10.1109/VTS.2018.8368633
Yu, S., C. Liu, W. Wen, and Y. Chen. “Special session on reliability and vulnerability of neuromorphic computing systems.” In Proceedings of the IEEE VLSI Test Symposium, 2018-April:1, 2018. https://doi.org/10.1109/VTS.2018.8368633.
Yu S, Liu C, Wen W, Chen Y. Special session on reliability and vulnerability of neuromorphic computing systems. In: Proceedings of the IEEE VLSI Test Symposium. 2018. p. 1.
Yu, S., et al. “Special session on reliability and vulnerability of neuromorphic computing systems.” Proceedings of the IEEE VLSI Test Symposium, vol. 2018-April, 2018, p. 1. Scopus, doi:10.1109/VTS.2018.8368633.
Yu S, Liu C, Wen W, Chen Y. Special session on reliability and vulnerability of neuromorphic computing systems. Proceedings of the IEEE VLSI Test Symposium. 2018. p. 1.

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

Publication Date

May 29, 2018

Volume

2018-April

Start / End Page

1