Simultaneous fluorescence and high-resolution bright-field imaging with aberration correction over a wide field-of-view with Fourier ptychographic microscopy (FPM) (Conference Presentation)
Publication
, Conference
Chung, J; Kim, J; Ou, X; Horstmeyer, R; Yang, C
Published in: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII
April 27, 2016
Duke Scholars
Published In
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII
DOI
Publication Date
April 27, 2016
Publisher
SPIE
Conference Name
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Chung, J., Kim, J., Ou, X., Horstmeyer, R., & Yang, C. (2016). Simultaneous fluorescence and high-resolution bright-field imaging with aberration correction over a wide field-of-view with Fourier ptychographic microscopy (FPM)
(Conference Presentation). In T. G. Brown, C. J. Cogswell, & T. Wilson (Eds.), Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII. SPIE. https://doi.org/10.1117/12.2211974
Chung, Jaebum, Jinho Kim, Xiaoze Ou, Roarke Horstmeyer, and Changhuei Yang. “Simultaneous fluorescence and high-resolution bright-field imaging with aberration correction over a wide field-of-view with Fourier ptychographic microscopy (FPM)
(Conference Presentation).” In Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, edited by Thomas G. Brown, Carol J. Cogswell, and Tony Wilson. SPIE, 2016. https://doi.org/10.1117/12.2211974.
Chung J, Kim J, Ou X, Horstmeyer R, Yang C. Simultaneous fluorescence and high-resolution bright-field imaging with aberration correction over a wide field-of-view with Fourier ptychographic microscopy (FPM)
(Conference Presentation). In: Brown TG, Cogswell CJ, Wilson T, editors. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII. SPIE; 2016.
Chung, Jaebum, et al. “Simultaneous fluorescence and high-resolution bright-field imaging with aberration correction over a wide field-of-view with Fourier ptychographic microscopy (FPM)
(Conference Presentation).” Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, edited by Thomas G. Brown et al., SPIE, 2016. Crossref, doi:10.1117/12.2211974.
Chung J, Kim J, Ou X, Horstmeyer R, Yang C. Simultaneous fluorescence and high-resolution bright-field imaging with aberration correction over a wide field-of-view with Fourier ptychographic microscopy (FPM)
(Conference Presentation). In: Brown TG, Cogswell CJ, Wilson T, editors. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII. SPIE; 2016.
Published In
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII
DOI
Publication Date
April 27, 2016
Publisher
SPIE
Conference Name
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII
Related Subject Headings
- 5102 Atomic, molecular and optical physics
- 4009 Electronics, sensors and digital hardware
- 4006 Communications engineering