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Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach

Publication ,  Conference
Liu, Y; Li, X
Published in: IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
October 22, 2018

The rapid development of industry 4.0 has promoted the extensive adoption of big data analytics for manufacturing industry. In this domain, virtual metrology is a critical technique that is able to reduce manufacturing cost over a large amount of practical applications. In this paper, we propose a novel tree-based approach for simultaneous feature selection and predictive modeling to facilitate efficient virtual metrology. The proposed method accurately identifies multiple feature sets and then chooses the best candidate to minimize modeling error. As demonstrated by the experimental results based on two industrial examples, the proposed method can achieve higher modeling accuracy and find a more complete feature set than the conventional approach implemented with orthogonal matching pursuit (OMP).

Duke Scholars

Published In

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

DOI

EISSN

1946-0759

ISSN

1946-0740

ISBN

9781538671085

Publication Date

October 22, 2018

Volume

2018-September

Start / End Page

845 / 852
 

Citation

APA
Chicago
ICMJE
MLA
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Liu, Y., & Li, X. (2018). Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach. In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA (Vol. 2018-September, pp. 845–852). https://doi.org/10.1109/ETFA.2018.8502480
Liu, Y., and X. Li. “Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach.” In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, 2018-September:845–52, 2018. https://doi.org/10.1109/ETFA.2018.8502480.
Liu Y, Li X. Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach. In: IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. 2018. p. 845–52.
Liu, Y., and X. Li. “Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach.” IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 2018-September, 2018, pp. 845–52. Scopus, doi:10.1109/ETFA.2018.8502480.
Liu Y, Li X. Predictive Modeling for Advanced Virtual Metrology: A Tree-Based Approach. IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. 2018. p. 845–852.

Published In

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

DOI

EISSN

1946-0759

ISSN

1946-0740

ISBN

9781538671085

Publication Date

October 22, 2018

Volume

2018-September

Start / End Page

845 / 852