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Fine-Grained Adaptive Testing Based on Quality Prediction

Publication ,  Conference
Liu, M; Pan, R; Ye, F; Li, X; Chakrabarty, K; Gu, X
Published in: Proceedings - International Test Conference
July 2, 2018

The ever-increasing complexity of integrated circuits inevitably leads to high test cost. Adaptive testing provides an effective solution for test-cost reduction; this testing framework selects the important test items for each set of chips. However, adaptive testing methods designed for digital circuits are coarse-grained, and they are targeted only at systematic defects. In order to incorporate fabrication variations and random defects in the testing framework, we propose a fine-grained adaptive testing method based on machine learning. We use the parametric test results from the previous stages of test to train a quality-prediction model for use in subsequent test stages. Next, we partition a given lot of chips into two groups based on their predicted quality. A test-selection method based on statistical learning is applied to the chips with high predicted quality. An ad hoc test-selection method is proposed and applied to the chips with low predicted quality. Experimental results using a large number of fabricated chips and the associated test data show that to achieve the same defect level as in prior work on adaptive testing, the fine-grained adaptive testing method reduces test cost by 90% for low-quality chips, and up to 7% for all the chips in a lot.

Duke Scholars

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

ISBN

9781538683828

Publication Date

July 2, 2018

Volume

2018-October
 

Citation

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Chicago
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MLA
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Liu, M., Pan, R., Ye, F., Li, X., Chakrabarty, K., & Gu, X. (2018). Fine-Grained Adaptive Testing Based on Quality Prediction. In Proceedings - International Test Conference (Vol. 2018-October). https://doi.org/10.1109/TEST.2018.8624891
Liu, M., R. Pan, F. Ye, X. Li, K. Chakrabarty, and X. Gu. “Fine-Grained Adaptive Testing Based on Quality Prediction.” In Proceedings - International Test Conference, Vol. 2018-October, 2018. https://doi.org/10.1109/TEST.2018.8624891.
Liu M, Pan R, Ye F, Li X, Chakrabarty K, Gu X. Fine-Grained Adaptive Testing Based on Quality Prediction. In: Proceedings - International Test Conference. 2018.
Liu, M., et al. “Fine-Grained Adaptive Testing Based on Quality Prediction.” Proceedings - International Test Conference, vol. 2018-October, 2018. Scopus, doi:10.1109/TEST.2018.8624891.
Liu M, Pan R, Ye F, Li X, Chakrabarty K, Gu X. Fine-Grained Adaptive Testing Based on Quality Prediction. Proceedings - International Test Conference. 2018.

Published In

Proceedings - International Test Conference

DOI

ISSN

1089-3539

ISBN

9781538683828

Publication Date

July 2, 2018

Volume

2018-October