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Board-Level Functional Fault Identification using Streaming Data

Publication ,  Conference
Liu, M; Ye, F; Li, X; Chakrabarty, K; Gu, X
Published in: Proceedings of the IEEE VLSI Test Symposium
April 1, 2019

High integration densities and design complexity of printed-circuit boards make board-level functional fault identification extremely difficult. Machine learning provides an opportunity to identify functional faults with high accuracy and thereby reduce repair cost. However, the large volume of manufacturing data comes in a streaming format and exhibits time-dependent concept drift in a production environment. These drawbacks limit the effectiveness of traditional machine-learning algorithms. We propose a diagnosis workflow that utilizes online learning to train classifiers incrementally with a small chunk of data at each step. These online learning algorithms adapt to concept drift quickly with carefully designed update rules. A hybrid algorithm is also proposed to handle the scenario that data for varying numbers of boards are collected at different times. Experimental results using two boards in high-volume production show that, with the help of online learning and the proposed hybrid algorithm, the F1-score for diagnosis can be improved from 57.3% to 78.9%.

Duke Scholars

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

ISBN

9781728111704

Publication Date

April 1, 2019

Volume

2019-April
 

Citation

APA
Chicago
ICMJE
MLA
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Liu, M., Ye, F., Li, X., Chakrabarty, K., & Gu, X. (2019). Board-Level Functional Fault Identification using Streaming Data. In Proceedings of the IEEE VLSI Test Symposium (Vol. 2019-April). https://doi.org/10.1109/VTS.2019.8758599
Liu, M., F. Ye, X. Li, K. Chakrabarty, and X. Gu. “Board-Level Functional Fault Identification using Streaming Data.” In Proceedings of the IEEE VLSI Test Symposium, Vol. 2019-April, 2019. https://doi.org/10.1109/VTS.2019.8758599.
Liu M, Ye F, Li X, Chakrabarty K, Gu X. Board-Level Functional Fault Identification using Streaming Data. In: Proceedings of the IEEE VLSI Test Symposium. 2019.
Liu, M., et al. “Board-Level Functional Fault Identification using Streaming Data.” Proceedings of the IEEE VLSI Test Symposium, vol. 2019-April, 2019. Scopus, doi:10.1109/VTS.2019.8758599.
Liu M, Ye F, Li X, Chakrabarty K, Gu X. Board-Level Functional Fault Identification using Streaming Data. Proceedings of the IEEE VLSI Test Symposium. 2019.

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

ISBN

9781728111704

Publication Date

April 1, 2019

Volume

2019-April